NAND/NOR Gate Polymorphism in Low Temperature Environment

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F12%3APU98219" target="_blank" >RIV/00216305:26230/12:PU98219 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

NAND/NOR Gate Polymorphism in Low Temperature Environment

Popis výsledku v původním jazyce

The fundamental aspect behind this paper is focused on behaviour of polymorphic digital circuits in potentially harsh operating environment. Unlike conventional CMOS-based circuits, the area of polymorphic electronics takes and an advantage of inherentlybuilt-in features that open up the possibility for on-the-fly adjustment of a particular circuit function with respect to the surrounding environment. The most prevalent benefit here is connected with the fact that space-efficient circuit implementationcan be achieved due to the adoption of polymorphic principles and, thus, eliminate the need for an additional function change controller. From a conceptual point of view, key attention is given to a set of experiments which were conducted with the aim to evaluate the influence of wide temperature range (with special interest in low temperatures domain) in case of reconfigurable chip with dedicated polymorphic gates. The experimental setup was based around reconfigurable polymorphic chip

Název v anglickém jazyce

NAND/NOR Gate Polymorphism in Low Temperature Environment

Popis výsledku anglicky

The fundamental aspect behind this paper is focused on behaviour of polymorphic digital circuits in potentially harsh operating environment. Unlike conventional CMOS-based circuits, the area of polymorphic electronics takes and an advantage of inherentlybuilt-in features that open up the possibility for on-the-fly adjustment of a particular circuit function with respect to the surrounding environment. The most prevalent benefit here is connected with the fact that space-efficient circuit implementationcan be achieved due to the adoption of polymorphic principles and, thus, eliminate the need for an additional function change controller. From a conceptual point of view, key attention is given to a set of experiments which were conducted with the aim to evaluate the influence of wide temperature range (with special interest in low temperatures domain) in case of reconfigurable chip with dedicated polymorphic gates. The experimental setup was based around reconfigurable polymorphic chip

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

ISBN

978-1-4673-1185-4

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

34-37

Název nakladatele

Institute of Electrical and Electronics Engineers

Místo vydání

Tallinn

Místo konání akce

Tallinn

Datum konání akce

18. 4. 2012

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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