Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F16%3APU121589" target="_blank" >RIV/00216305:26230/16:PU121589 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.fit.vutbr.cz/research/pubs/all.php?id=11073" target="_blank" >http://www.fit.vutbr.cz/research/pubs/all.php?id=11073</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

Popis výsledku v původním jazyce

The paper presents a method of modeling and analysis of fault-tolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as fault-tree or Markov reliability models of the above-specified systems. Main goal of the paper is to show that - taking the advantage of SMC - the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool.

Název v anglickém jazyce

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

Popis výsledku anglicky

The paper presents a method of modeling and analysis of fault-tolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as fault-tree or Markov reliability models of the above-specified systems. Main goal of the paper is to show that - taking the advantage of SMC - the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

20206 - Computer hardware and architecture

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

ISBN

978-80-8086-256-5

ISSN

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e-ISSN

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Počet stran výsledku

6

Strana od-do

32-37

Název nakladatele

Slovak University of Technology in Bratislava

Místo vydání

Bratislava

Místo konání akce

Košice

Datum konání akce

20. 4. 2016

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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