DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F25%3APU155128" target="_blank" >RIV/00216305:26230/25:PU155128 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.scitepress.org/publishedPapers/2025/133149/pdf/index.html" target="_blank" >https://www.scitepress.org/publishedPapers/2025/133149/pdf/index.html</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation

Popis výsledku v původním jazyce

Accurate stitching of overlapping image tiles is essential for reconstructing large-scale Electron Microscopy (EM) images during Whole Slide Imaging. Current stitching approaches rely on handcrafted features and translation-only global alignment based on Minimum Spanning Tree (MST) construction. This results in suboptimal global alignment since it neglects rotational errors and works only with transformations estimated from pairwise feature matches, discarding valuable information tied to individual features. Moreover, handcrafted features may have trouble with repetitive textures. Motivated by the limitations of current methods and recent advancements in deep learning, we propose DEMIS, a novel EM image stitching method. DEMIS uses Local Feature TRansformer (LoFTR) for image matching, and optimises translational and rotational parameters directly at the level of individual features. For evaluation and training, we create EM424, a synthetic dataset generated by splitting high-resolution EM

Název v anglickém jazyce

DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation

Popis výsledku anglicky

Accurate stitching of overlapping image tiles is essential for reconstructing large-scale Electron Microscopy (EM) images during Whole Slide Imaging. Current stitching approaches rely on handcrafted features and translation-only global alignment based on Minimum Spanning Tree (MST) construction. This results in suboptimal global alignment since it neglects rotational errors and works only with transformations estimated from pairwise feature matches, discarding valuable information tied to individual features. Moreover, handcrafted features may have trouble with repetitive textures. Motivated by the limitations of current methods and recent advancements in deep learning, we propose DEMIS, a novel EM image stitching method. DEMIS uses Local Feature TRansformer (LoFTR) for image matching, and optimises translational and rotational parameters directly at the level of individual features. For evaluation and training, we create EM424, a synthetic dataset generated by splitting high-resolution EM

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů