Coherent x-ray scattering in an XPEEM setup

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F20%3APU139652" target="_blank" >RIV/00216305:26620/20:PU139652 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0304399120300759?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0304399120300759?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ultramic.2020.113035" target="_blank" >10.1016/j.ultramic.2020.113035</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Coherent x-ray scattering in an XPEEM setup

Popis výsledku v původním jazyce

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

Název v anglickém jazyce

Coherent x-ray scattering in an XPEEM setup

Popis výsledku anglicky

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

<a href="/cs/project/LM2015041" target="_blank" >LM2015041: CEITEC Nano</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Ultramicroscopy

ISSN

0304-3991

e-ISSN

1879-2723

Svazek periodika

216

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

8

Strana od-do

„113035-1“-„113035-8“

Kód UT WoS článku

000570058500001

EID výsledku v databázi Scopus

2-s2.0-85086299521