Energy gap measurements based on enhanced absorption coefficient calculation from transmittance and reflectance raw data

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU150382" target="_blank" >RIV/00216305:26620/24:PU150382 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081723:_____/24:00583079 RIV/68081731:_____/24:00583079

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/1402-4896/ad1cb8" target="_blank" >https://iopscience.iop.org/article/10.1088/1402-4896/ad1cb8</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1402-4896/ad1cb8" target="_blank" >10.1088/1402-4896/ad1cb8</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Energy gap measurements based on enhanced absorption coefficient calculation from transmittance and reflectance raw data

Popis výsledku v původním jazyce

The absorption coefficient plays an important role in studying and characterizing semiconducting materials. It is an important parameter to study the mechanism of photons absorption within the structure of the studied material. Thus, it helps to study the several types of charge carrier transport along with the energy band structure and its defects. In literature, a formula was reported to precisely calculate the absorption coefficient from raw data of transmittance and reflectance of electromagnetic radiation. However, the reported formula has several issues limiting its validity in the literature. In this paper, we provide a more mathematically accurate form of this equation to precisely obtain the absorption coefficient from the raw data, by considering the total internal reflection at the different interfaces. Moreover, the equation is tested by simulated data and is applied to study the optical characteristics of a single-component epoxy resin from its transmittance and reflectance raw data.

Název v anglickém jazyce

Energy gap measurements based on enhanced absorption coefficient calculation from transmittance and reflectance raw data

Popis výsledku anglicky

The absorption coefficient plays an important role in studying and characterizing semiconducting materials. It is an important parameter to study the mechanism of photons absorption within the structure of the studied material. Thus, it helps to study the several types of charge carrier transport along with the energy band structure and its defects. In literature, a formula was reported to precisely calculate the absorption coefficient from raw data of transmittance and reflectance of electromagnetic radiation. However, the reported formula has several issues limiting its validity in the literature. In this paper, we provide a more mathematically accurate form of this equation to precisely obtain the absorption coefficient from the raw data, by considering the total internal reflection at the different interfaces. Moreover, the equation is tested by simulated data and is applied to study the optical characteristics of a single-component epoxy resin from its transmittance and reflectance raw data.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

PHYSICA SCRIPTA

ISSN

0031-8949

e-ISSN

1402-4896

Svazek periodika

99

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

SE - Švédské království

Počet stran výsledku

9

Strana od-do

1-9

Kód UT WoS článku

001144243500001

EID výsledku v databázi Scopus

2-s2.0-85182745582