Comprehensive analysis of charge carriers dynamics through the honeycomb structure of graphite thin films and polymer graphite with applications in cold field emission and scanning tunneling microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU152194" target="_blank" >RIV/00216305:26620/24:PU152194 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081731:_____/24:00598497

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S2468023024012586?pes=vor" target="_blank" >https://www.sciencedirect.com/science/article/pii/S2468023024012586?pes=vor</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.surfin.2024.105102" target="_blank" >10.1016/j.surfin.2024.105102</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Comprehensive analysis of charge carriers dynamics through the honeycomb structure of graphite thin films and polymer graphite with applications in cold field emission and scanning tunneling microscopy

Popis výsledku v původním jazyce

Polymer graphite electron sources have performed satisfactorily as field emission emitters and scanning tunneling microscopy probes in the past few years. However, the emission process was characterized by limited total emission currents. This paper introduces the elemental, vibrational, electronic structure, and optical analysis of polymer graphite and glass-graphite composite field emission cathodes to study these limitations. Moreover, the field emission characteristics are studied including the changes in the potential energy barrier of the used materials and structures. Among the studied structures, the cathodes prepared from graphite thin films deposited on a micropointed glass substrate (film-GMF) showed superior performance as random field emission arrays. This includes obtaining much higher emission current values ≈ 20 times) and lower threshold voltages ≈ 1/2) compared to the results obtained from polymer graphite samples. The enhancement factor in such emitters is believed to be the three-dimensional honeycomb structure of graphite. Moreover, the study includes applying graphite coatings to tungsten nano-field emission cathodes and scanning tunneling microscopy probes, which improves the performance of such cathodes/probes in both microscopic techniques.

Název v anglickém jazyce

Comprehensive analysis of charge carriers dynamics through the honeycomb structure of graphite thin films and polymer graphite with applications in cold field emission and scanning tunneling microscopy

Popis výsledku anglicky

Polymer graphite electron sources have performed satisfactorily as field emission emitters and scanning tunneling microscopy probes in the past few years. However, the emission process was characterized by limited total emission currents. This paper introduces the elemental, vibrational, electronic structure, and optical analysis of polymer graphite and glass-graphite composite field emission cathodes to study these limitations. Moreover, the field emission characteristics are studied including the changes in the potential energy barrier of the used materials and structures. Among the studied structures, the cathodes prepared from graphite thin films deposited on a micropointed glass substrate (film-GMF) showed superior performance as random field emission arrays. This includes obtaining much higher emission current values ≈ 20 times) and lower threshold voltages ≈ 1/2) compared to the results obtained from polymer graphite samples. The enhancement factor in such emitters is believed to be the three-dimensional honeycomb structure of graphite. Moreover, the study includes applying graphite coatings to tungsten nano-field emission cathodes and scanning tunneling microscopy probes, which improves the performance of such cathodes/probes in both microscopic techniques.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

<a href="/cs/project/FW03010504" target="_blank" >FW03010504: Vývoj in-situ technik pro charakterizaci materiálů a nanostruktur</a><br>

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

SURFACES AND INTERFACES

ISSN

2468-0230

e-ISSN

—

Svazek periodika

53

Číslo periodika v rámci svazku

October 2024

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

15

Strana od-do

1-15

Kód UT WoS článku

001316854900001

EID výsledku v databázi Scopus

2-s2.0-85203813847