4D-STEM in an FIB-SEM: A Proper Tool to Characterize Perovskite Single-Photon Emitters and Solar Cells

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F25%3APU156325" target="_blank" >RIV/00216305:26620/25:PU156325 - isvavai.cz</a>

Výsledek na webu

<a href="https://pubs.acs.org/doi/10.1021/acs.jpcc.4c08042" target="_blank" >https://pubs.acs.org/doi/10.1021/acs.jpcc.4c08042</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acs.jpcc.4c08042" target="_blank" >10.1021/acs.jpcc.4c08042</a>

Jazyk výsledku

angličtina

Název v původním jazyce

4D-STEM in an FIB-SEM: A Proper Tool to Characterize Perovskite Single-Photon Emitters and Solar Cells

Popis výsledku v původním jazyce

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a characterization technique that allows high-resolution imaging of thin samples while providing structural and crystallographic information. We have developed a 4D-STEM solution for scanning electron microscopes, enabling lamella fabrication and analysis without exposing the lamella to air. This technique has been used to analyze emerging materials, including low-dimensional lead halide perovskites and perovskite solar cells. We resolved individual CsPbBr3 nanocrystals, determined their lattice constant, and mapped their crystallographic orientation, locating well-ordered superlattice ensembles for single-photon emission. In perovskite solar cells, we observed a nondegenerate tetragonal MAPbI3 photoactive layer and documented the amorphization and subsequent degradation of the MA3Bi2I9 photoactive layer when exposed to air. Our findings facilitate the identification and characterization of lead halide perovskite nanocrystal ensembles and perovskite photoactive layers, thereby reducing the time required for these processes. This efficiency is generally valuable for large-scale production and quality control of materials manufactured on an industrial scale.

Název v anglickém jazyce

4D-STEM in an FIB-SEM: A Proper Tool to Characterize Perovskite Single-Photon Emitters and Solar Cells

Popis výsledku anglicky

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a characterization technique that allows high-resolution imaging of thin samples while providing structural and crystallographic information. We have developed a 4D-STEM solution for scanning electron microscopes, enabling lamella fabrication and analysis without exposing the lamella to air. This technique has been used to analyze emerging materials, including low-dimensional lead halide perovskites and perovskite solar cells. We resolved individual CsPbBr3 nanocrystals, determined their lattice constant, and mapped their crystallographic orientation, locating well-ordered superlattice ensembles for single-photon emission. In perovskite solar cells, we observed a nondegenerate tetragonal MAPbI3 photoactive layer and documented the amorphization and subsequent degradation of the MA3Bi2I9 photoactive layer when exposed to air. Our findings facilitate the identification and characterization of lead halide perovskite nanocrystal ensembles and perovskite photoactive layers, thereby reducing the time required for these processes. This efficiency is generally valuable for large-scale production and quality control of materials manufactured on an industrial scale.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10403 - Physical chemistry

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Physical Chemistry C (web)

ISSN

1932-7447

e-ISSN

1932-7455

Svazek periodika

129

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

3905-3912

Kód UT WoS článku

001415250000001

EID výsledku v databázi Scopus

2-s2.0-85217114816