TKD and STEM in SEM analysis of ODS steels from the DEHITERE project

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F26722445%3A_____%2F23%3AN0000101" target="_blank" >RIV/26722445:_____/23:N0000101 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

TKD and STEM in SEM analysis of ODS steels from the DEHITERE project

Popis výsledku v původním jazyce

The main advantage of TKD over conventional EBSD is its improved spatial resolution. This enables to characterize the nanocrystalline and deformed materials effectively. It also provides the crystal structure information of precipitates and second phase particles of sizes about ~10 nm and bigger. It is possible to obtain sub-10 nm resolution using TKD, however, it depends on the sample atomic number, beam energy, sample thickness and tilt angle which all influence the final spatial resolution. The samples prepared for TEM analysis can be used to perform TKD analysis. The ideal sample thickness to perform TKD scan is less than 100 nm. The below scan shown in Fig. 1(a), was performed on the fine-grained region of the ODS steel prepared from the electrolytic polishing method. Figure 1(b and c) indicates the typical maps (inverse pole figure and image quality map) obtained from the EBSD analysis. IPF map indicates that high angle grain boundaries are not completely evolved in the microstructure yet as low angle sub-grain boundaries can be observed in a few grains. The grain size varied from ~150 to 700 nm in the small scan performed. Another small scan on hydrided Zircaloy-4 is also performed, (see Fig. 2). This sample is prepared from the focused ion milling route. More unindexed points are found in this sample after the TKD scan is because of the highly deformed sample and different sample preparation route (it is unknown how different preparation route influence the indexing). Report CVR-5072.

Název v anglickém jazyce

TKD and STEM in SEM analysis of ODS steels from the DEHITERE project

Popis výsledku anglicky

The main advantage of TKD over conventional EBSD is its improved spatial resolution. This enables to characterize the nanocrystalline and deformed materials effectively. It also provides the crystal structure information of precipitates and second phase particles of sizes about ~10 nm and bigger. It is possible to obtain sub-10 nm resolution using TKD, however, it depends on the sample atomic number, beam energy, sample thickness and tilt angle which all influence the final spatial resolution. The samples prepared for TEM analysis can be used to perform TKD analysis. The ideal sample thickness to perform TKD scan is less than 100 nm. The below scan shown in Fig. 1(a), was performed on the fine-grained region of the ODS steel prepared from the electrolytic polishing method. Figure 1(b and c) indicates the typical maps (inverse pole figure and image quality map) obtained from the EBSD analysis. IPF map indicates that high angle grain boundaries are not completely evolved in the microstructure yet as low angle sub-grain boundaries can be observed in a few grains. The grain size varied from ~150 to 700 nm in the small scan performed. Another small scan on hydrided Zircaloy-4 is also performed, (see Fig. 2). This sample is prepared from the focused ion milling route. More unindexed points are found in this sample after the TKD scan is because of the highly deformed sample and different sample preparation route (it is unknown how different preparation route influence the indexing). Report CVR-5072.

Druh

O - Ostatní výsledky

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

—

Návaznosti

—

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů