Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F47813059%3A19240%2F01%3A20000009" target="_blank" >RIV/47813059:19240/01:20000009 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.

Popis výsledku v původním jazyce

The spectral interference of two beams from a white-light source, a tungsten halogen lamp, is measured at the output of a dispersive Michelson interferometer by a low-resolution miniature fiber optic spectrometer when the interferometer beam splitter ismade of fused silica. It is confirmed that the spectral interference fringes are resolved only in the vicinity of the equalization wavelength whose value is dependent on the group optical path difference in the interferometer. Thus, the equalization wavelength is measured as a function of the displacement in the interferometer in the spectral range approximately from 490 to 870 nm. Moreover, when the group refractive index of fused silica is evaluated at the equalization wavelengths by using the Sellmeier dispersion equation, it is confirmed, in accordance with the theory, that the measured displacement as a function of the group refractive index of fused silica is a straight line whose slope gives the effective thickness of the beam sp

Název v anglickém jazyce

Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.

Popis výsledku anglicky

The spectral interference of two beams from a white-light source, a tungsten halogen lamp, is measured at the output of a dispersive Michelson interferometer by a low-resolution miniature fiber optic spectrometer when the interferometer beam splitter ismade of fused silica. It is confirmed that the spectral interference fringes are resolved only in the vicinity of the equalization wavelength whose value is dependent on the group optical path difference in the interferometer. Thus, the equalization wavelength is measured as a function of the displacement in the interferometer in the spectral range approximately from 490 to 870 nm. Moreover, when the group refractive index of fused silica is evaluated at the equalization wavelengths by using the Sellmeier dispersion equation, it is confirmed, in accordance with the theory, that the measured displacement as a function of the group refractive index of fused silica is a straight line whose slope gives the effective thickness of the beam sp

Druh

D - Stať ve sborníku

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F01%2F0077" target="_blank" >GA202/01/0077: Vlnovodné a magnetooptické reflexní jevy v tenkých vrstvách a nízkodimenzionálních systémech</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2001

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

ISBN

0-8194-4093-0

ISSN

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e-ISSN

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Počet stran výsledku

9

Strana od-do

229-23

Název nakladatele

SPIE-The International Society for Optical Engineering

Místo vydání

Munich

Místo konání akce

Munich, Germany

Datum konání akce

18. 8. 2001

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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