Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43967087" target="_blank" >RIV/49777513:23220/22:43967087 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21670/22:00357010

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/1748-0221/17/01/C01025/meta" target="_blank" >https://iopscience.iop.org/article/10.1088/1748-0221/17/01/C01025/meta</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/17/01/C01025" target="_blank" >10.1088/1748-0221/17/01/C01025</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2

Popis výsledku v původním jazyce

In the present work, we study the Timepix2 pixels&apos; high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.

Název v anglickém jazyce

Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2

Popis výsledku anglicky

In the present work, we study the Timepix2 pixels&apos; high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10303 - Particles and field physics

Projekt

<a href="/cs/project/EF16_019%2F0000766" target="_blank" >EF16_019/0000766: Inženýrské aplikace fyziky mikrosvěta</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

1748-0221

Svazek periodika

17

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

10

Strana od-do

nestrankovano

Kód UT WoS článku

000757419300004

EID výsledku v databázi Scopus

2-s2.0-85125543199