Zinc-based reference materials for glow discharge optical emission spectrometry: sputter factors and emission yields

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F00%3A00056423" target="_blank" >RIV/49777513:23520/00:00056423 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Zinc-based reference materials for glow discharge optical emission spectrometry: sputter factors and emission yields

Popis výsledku v původním jazyce

A set of new ZnAl reference materials (RMs) is described, intending to support the depth profile analysis of zinc-based coatings by GD-OES. The RMs were subject to a two-stage certification procedure: first, they were analyzed for their composition by methods other than GD-OES, mostly by wet chemical methods. In the second step, sputter factors of these RMs were determined, based on the GD-OES measurements. For this purpose, the standard model of matrix-independent emission yields was used to relate theGD-OES intensities of selected elements to the compositions of the RMs, found from the first stage of the certification procedure. In the data, evidence was found that the model of matrix-independent emission yields is violated for the matrices involved.

Název v anglickém jazyce

Zinc-based reference materials for glow discharge optical emission spectrometry: sputter factors and emission yields

Popis výsledku anglicky

A set of new ZnAl reference materials (RMs) is described, intending to support the depth profile analysis of zinc-based coatings by GD-OES. The RMs were subject to a two-stage certification procedure: first, they were analyzed for their composition by methods other than GD-OES, mostly by wet chemical methods. In the second step, sputter factors of these RMs were determined, based on the GD-OES measurements. For this purpose, the standard model of matrix-independent emission yields was used to relate theGD-OES intensities of selected elements to the compositions of the RMs, found from the first stage of the certification procedure. In the data, evidence was found that the model of matrix-independent emission yields is violated for the matrices involved.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BL - Fyzika plasmatu a výboje v plynech

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2000

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Analytical Atomic Spectrometry

ISSN

02679477

e-ISSN

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Svazek periodika

1

Číslo periodika v rámci svazku

Č. 15

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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