Active thermography methods for near-surface layers inspection

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F17%3A43950785" target="_blank" >RIV/49777513:23640/17:43950785 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Active thermography methods for near-surface layers inspection

Popis výsledku v původním jazyce

Active thermography is a method for infrared non-destructive testing of materials. This method is based on an external excitation of a measured sample and a thermographic analysis of its thermal response. The method has a lot of configurations and is usable for a wide range of applications and materials. However, it is especially suited for thin samples and near-surface layers. Pulsed thermography with a flash-lamp excitation source and Lock-In thermography with a LED-lamp excitation source are introduced in this contribution. A usability of both methods is demonstrated on an inspection of a stainless steel surface affected by laser marking and solar cells non-contact testing. Inspection of a stainless steel surface affected by the laser marking shows that both methods can detect changes made by the laser in a very thin stainless steel surface layer. Solar cells non-contact testing example shows that LED Lock-In thermographic analysis is able to detect some types of damages connected with electrical properties of the cells. It is shown, that it is complicated to detect these defects by a flash-pulse thermographic analysis. However, it is shown that the flash-pulse analysis is able to detect some material inhomogeneities, which are not detectable by the LED Lock-In inspection. Differences between the methods and their advantages or disadvantages in connection with the described examples are discussed in the contribution.

Název v anglickém jazyce

Active thermography methods for near-surface layers inspection

Popis výsledku anglicky

Active thermography is a method for infrared non-destructive testing of materials. This method is based on an external excitation of a measured sample and a thermographic analysis of its thermal response. The method has a lot of configurations and is usable for a wide range of applications and materials. However, it is especially suited for thin samples and near-surface layers. Pulsed thermography with a flash-lamp excitation source and Lock-In thermography with a LED-lamp excitation source are introduced in this contribution. A usability of both methods is demonstrated on an inspection of a stainless steel surface affected by laser marking and solar cells non-contact testing. Inspection of a stainless steel surface affected by the laser marking shows that both methods can detect changes made by the laser in a very thin stainless steel surface layer. Solar cells non-contact testing example shows that LED Lock-In thermographic analysis is able to detect some types of damages connected with electrical properties of the cells. It is shown, that it is complicated to detect these defects by a flash-pulse thermographic analysis. However, it is shown that the flash-pulse analysis is able to detect some material inhomogeneities, which are not detectable by the LED Lock-In inspection. Differences between the methods and their advantages or disadvantages in connection with the described examples are discussed in the contribution.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů