Analysis of Accelerated Reliability Testing Data of Electronic Component in Combat Vehicles

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F19%3A00537271" target="_blank" >RIV/60162694:G43__/19:00537271 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.3850/978-981-11-2724-30960-cd" target="_blank" >http://dx.doi.org/10.3850/978-981-11-2724-30960-cd</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3850/978-981-11-2724-30960-cd" target="_blank" >10.3850/978-981-11-2724-30960-cd</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Analysis of Accelerated Reliability Testing Data of Electronic Component in Combat Vehicles

Popis výsledku v původním jazyce

The first step in analysing accelerated reliability testing data is to select an appropriate probability distribution. Experience shows that most of the test data collected at each stress levels can usually be appropriately fitted onto one of the underlying distributions, namely exponential, Weibull and lognormal distributions. The next step in statistical analysis is to choose an acceleration model (Arrhenius, Eyring, Inverse power law (IPL), Coffin-Manson model, etc.) that quantify the way in which probability distribution varies across different stress levels in order to extrapolate probability distribution at the level of use stress. This extrapolated probability distribution can then be used to estimate product reliability such as the probability of failure, failure rate, mean operating time between failures (MTBF) or mean time to failure (MTTF). The paper deals with a statistical analysis of failure data from accelerated reliability testing of light emitting diodes (LEDs) in military vehicles.

Název v anglickém jazyce

Analysis of Accelerated Reliability Testing Data of Electronic Component in Combat Vehicles

Popis výsledku anglicky

The first step in analysing accelerated reliability testing data is to select an appropriate probability distribution. Experience shows that most of the test data collected at each stress levels can usually be appropriately fitted onto one of the underlying distributions, namely exponential, Weibull and lognormal distributions. The next step in statistical analysis is to choose an acceleration model (Arrhenius, Eyring, Inverse power law (IPL), Coffin-Manson model, etc.) that quantify the way in which probability distribution varies across different stress levels in order to extrapolate probability distribution at the level of use stress. This extrapolated probability distribution can then be used to estimate product reliability such as the probability of failure, failure rate, mean operating time between failures (MTBF) or mean time to failure (MTTF). The paper deals with a statistical analysis of failure data from accelerated reliability testing of light emitting diodes (LEDs) in military vehicles.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20104 - Transport engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 29th European Safety and Reliability Conference - ESREL 2019

ISBN

978-981-11-2724-3

ISSN

—

e-ISSN

—

Počet stran výsledku

6

Strana od-do

796-801

Název nakladatele

Research Publishing

Místo vydání

Singapore

Místo konání akce

Hannover

Datum konání akce

22. 9. 2019

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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