Three-parameter Weibull distribution with upper limit applicable in reliability studies and materials testing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F23%3A00558235" target="_blank" >RIV/60162694:G43__/23:00558235 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0026271422002931" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0026271422002931</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.microrel.2022.114769" target="_blank" >10.1016/j.microrel.2022.114769</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Three-parameter Weibull distribution with upper limit applicable in reliability studies and materials testing

Popis výsledku v původním jazyce

The Weibull plot with concave shape of an experimental curve mostly indicates the necessity to use the three-parameter Weibull distribution with nonzero location parameter, which represents the lower limit of studied data set. The paper proposes a three-parameter Weibull distribution function with the localization parameter representing the upper limit of the studied data set. This function is suitable for the Weibull plot with convex shape of experimental curve. Several examples of applying the newly proposed function are presented: for lifetime or time-to-breakdown in reliability studies and for strength properties in materials testing.

Název v anglickém jazyce

Three-parameter Weibull distribution with upper limit applicable in reliability studies and materials testing

Popis výsledku anglicky

The Weibull plot with concave shape of an experimental curve mostly indicates the necessity to use the three-parameter Weibull distribution with nonzero location parameter, which represents the lower limit of studied data set. The paper proposes a three-parameter Weibull distribution function with the localization parameter representing the upper limit of the studied data set. This function is suitable for the Weibull plot with convex shape of experimental curve. Several examples of applying the newly proposed function are presented: for lifetime or time-to-breakdown in reliability studies and for strength properties in materials testing.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microelectronics Reliability

ISSN

0026-2714

e-ISSN

1872-941X

Svazek periodika

137

Číslo periodika v rámci svazku

October

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

10

Strana od-do

114769

Kód UT WoS článku

000862867200008

EID výsledku v databázi Scopus

2-s2.0-85137060291