Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F20%3A43920430" target="_blank" >RIV/60461373:22310/20:43920430 - isvavai.cz</a>

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/2053-1583/aba9a0" target="_blank" >https://iopscience.iop.org/article/10.1088/2053-1583/aba9a0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/2053-1583/aba9a0" target="_blank" >10.1088/2053-1583/aba9a0</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

Popis výsledku v původním jazyce

Thin films of noble-metal-based transition metal dichalcogenides, such as PtSe2, have attracted increasing attention due to their interesting layer-number dependent properties and application potential. While it is difficult to cleave bulk crystals down to mono- and few-layers, a range of growth techniques have been established producing material of varying quality and layer number. However, to date, no reliable high-throughput characterization to assess layer number exists. Here, we use top-down liquid phase exfoliation (LPE) coupled with centrifugation to produce PtSe2 nanosheets of varying sizes and thicknesses with a low degree of basal plane defectiveness. Measurement of the dimensions by statistical atomic force microscopy allows us to quantitatively link information contained in optical spectra to the dimensions. For LPE nanosheets we establish metrics for lateral size and layer number based on extinction spectroscopy. Further, we compare the Raman spectroscopic response of LPE nanosheets with micromechanically exfoliated PtSe2, as well as thin films produced by a range of bottom up techniques. We demonstrate that the Eg1 peak position and the intensity ratio of the Eg1/A1g1 peaks can serve as a robust metric for layer number across all sample types.This will be of importance in future benchmarking of PtSe2 films. © 2020 IOP Publishing Ltd

Název v anglickém jazyce

Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

Popis výsledku anglicky

Thin films of noble-metal-based transition metal dichalcogenides, such as PtSe2, have attracted increasing attention due to their interesting layer-number dependent properties and application potential. While it is difficult to cleave bulk crystals down to mono- and few-layers, a range of growth techniques have been established producing material of varying quality and layer number. However, to date, no reliable high-throughput characterization to assess layer number exists. Here, we use top-down liquid phase exfoliation (LPE) coupled with centrifugation to produce PtSe2 nanosheets of varying sizes and thicknesses with a low degree of basal plane defectiveness. Measurement of the dimensions by statistical atomic force microscopy allows us to quantitatively link information contained in optical spectra to the dimensions. For LPE nanosheets we establish metrics for lateral size and layer number based on extinction spectroscopy. Further, we compare the Raman spectroscopic response of LPE nanosheets with micromechanically exfoliated PtSe2, as well as thin films produced by a range of bottom up techniques. We demonstrate that the Eg1 peak position and the intensity ratio of the Eg1/A1g1 peaks can serve as a robust metric for layer number across all sample types.This will be of importance in future benchmarking of PtSe2 films. © 2020 IOP Publishing Ltd

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10402 - Inorganic and nuclear chemistry

Projekt

<a href="/cs/project/GC20-16124J" target="_blank" >GC20-16124J: Dvojdimenzionální vrstevnaté dichalkogenidy přechodných kovů / nanostrukturované uhlíkové kompozity pro aplikace na elektrochemické uchovávání energie</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

2D MATERIALS

ISSN

2053-1583

e-ISSN

—

Svazek periodika

7

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

12

Strana od-do

—

Kód UT WoS článku

000573289600001

EID výsledku v databázi Scopus

2-s2.0-85092564456