Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F25%3A43933135" target="_blank" >RIV/60461373:22310/25:43933135 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0030401825008776" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0030401825008776</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.optcom.2025.132349" target="_blank" >10.1016/j.optcom.2025.132349</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

Popis výsledku v původním jazyce

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thicknessdependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tipenhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A2g Raman mode relative to the A3g mode in thinner flakes. The I (A2g)/I (A3g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electron-phonon coupling near the band edge. Our results establish the I (A2g)/I (A3g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structure-property relationships in emerging low-dimensional materials.

Název v anglickém jazyce

Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

Popis výsledku anglicky

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thicknessdependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tipenhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A2g Raman mode relative to the A3g mode in thinner flakes. The I (A2g)/I (A3g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electron-phonon coupling near the band edge. Our results establish the I (A2g)/I (A3g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structure-property relationships in emerging low-dimensional materials.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10300 - Physical sciences

Projekt

<a href="/cs/project/GM23-08083M" target="_blank" >GM23-08083M: Na míru šité nízko-dimenzionální vrstevnaté materiály za hranicí grafenu a jejich využití v základním výzkumu heterogenních katalyzátorů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

OPTICS COMMUNICATIONS

ISSN

0030-4018

e-ISSN

1873-0310

Svazek periodika

595

Číslo periodika v rámci svazku

595

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

132349

Kód UT WoS článku

001561425100001

EID výsledku v databázi Scopus

2-s2.0-105013758138