Thin Organic Layers Diagnostics by Image Analysis

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Thin Organic Layers Diagnostics by Image Analysis

Popis výsledku v původním jazyce

Image processing has wide range of applications at field of a modern science. This presented work deals with thin organic layers diagnostic by image analysis. Thin layers were prepared by spin coating method. Solution of coated material in suitable volatile solvent is applied onto surface of a rotating substrate in this method. Solvent is evaporated and centrifuged. After finalization of the spinning process thin layer of coated material is created onto the substrate. Prepared thin layers were diagnosedby image analysis. Used instruments were optical microscope; digital camera and software NIS-Elements AR 2.30 type Advanced Research by Laboratory Imaging company. An image analysis technique was used to measure dependences of degree of coverage of thesubstrate surface on the concentration, the speed of rotation and the spinning time.

Název v anglickém jazyce

Thin Organic Layers Diagnostics by Image Analysis

Popis výsledku anglicky

Image processing has wide range of applications at field of a modern science. This presented work deals with thin organic layers diagnostic by image analysis. Thin layers were prepared by spin coating method. Solution of coated material in suitable volatile solvent is applied onto surface of a rotating substrate in this method. Solvent is evaporated and centrifuged. After finalization of the spinning process thin layer of coated material is created onto the substrate. Prepared thin layers were diagnosedby image analysis. Used instruments were optical microscope; digital camera and software NIS-Elements AR 2.30 type Advanced Research by Laboratory Imaging company. An image analysis technique was used to measure dependences of degree of coverage of thesubstrate surface on the concentration, the speed of rotation and the spinning time.

Druh

D - Stať ve sborníku

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of 9th International Conference Process Control 2010

ISBN

978-80-7399-951-3

ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

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Název nakladatele

Tribun EU, s.r.o.

Místo vydání

Brno

Místo konání akce

Kouty nad Desnou (CZ)

Datum konání akce

1. 1. 2010

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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