Collisions of low-energy ions Ar+ and N2 + with room-temperature and heated surfaces of tungsten, beryllium, and a mixed beryllium?tungsten thin film

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F13%3A00398510" target="_blank" >RIV/61388955:_____/13:00398510 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.ijms.2013.06.002" target="_blank" >http://dx.doi.org/10.1016/j.ijms.2013.06.002</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ijms.2013.06.002" target="_blank" >10.1016/j.ijms.2013.06.002</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Collisions of low-energy ions Ar+ and N2 + with room-temperature and heated surfaces of tungsten, beryllium, and a mixed beryllium?tungsten thin film

Popis výsledku v původním jazyce

Mass spectra of product ions arising from collisions of the seeding gas ions Ar+ and N2 + with room temperature and heated (150 C and 300 C) surfaces of the prospective fusion-device materials, tungsten, beryllium, and a thin mixed film of beryllium andtungsten on a silicon substrate were measured over the incident energy range of the projectile ions 15?70 eV. A fraction of the product ions were in all cases sputtered hydrocarbon ions from the hydrocarbon surface layer which covers the surfaces at roomtemperature and gradually diminishes with increasing surface temperature. Sputtering of the of the sample substrate was observed only with the beryllium and mixed beryllium?tungsten film surfaces (ions of Be+,BeOH+,BeH+,BeO+) while sample impurities yieldedNa+, K+ and, in the case of the beryllium surface also Li+,Mg+, Ca+, CaOH+. With the tungsten surface, no sputtered ions of tungsten or its compounds could be detected. The differences between the impact of Ar+ and N2 + in product ion

Název v anglickém jazyce

Collisions of low-energy ions Ar+ and N2 + with room-temperature and heated surfaces of tungsten, beryllium, and a mixed beryllium?tungsten thin film

Popis výsledku anglicky

Mass spectra of product ions arising from collisions of the seeding gas ions Ar+ and N2 + with room temperature and heated (150 C and 300 C) surfaces of the prospective fusion-device materials, tungsten, beryllium, and a thin mixed film of beryllium andtungsten on a silicon substrate were measured over the incident energy range of the projectile ions 15?70 eV. A fraction of the product ions were in all cases sputtered hydrocarbon ions from the hydrocarbon surface layer which covers the surfaces at roomtemperature and gradually diminishes with increasing surface temperature. Sputtering of the of the sample substrate was observed only with the beryllium and mixed beryllium?tungsten film surfaces (ions of Be+,BeOH+,BeH+,BeO+) while sample impurities yieldedNa+, K+ and, in the case of the beryllium surface also Li+,Mg+, Ca+, CaOH+. With the tungsten surface, no sputtered ions of tungsten or its compounds could be detected. The differences between the impact of Ar+ and N2 + in product ion

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

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Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

International Journal of Mass Spectrometry

ISSN

1387-3806

e-ISSN

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Svazek periodika

354-355

Číslo periodika v rámci svazku

SI

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

9

Strana od-do

78-86

Kód UT WoS článku

000327809900013

EID výsledku v databázi Scopus

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