Transparent rutile TiO2 films prepared by thermal oxidation of sputtered Ti on FTO glass
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F19%3A00503932" target="_blank" >RIV/61388955:_____/19:00503932 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68378271:_____/19:00503932 RIV/60461373:22310/19:43918608
Výsledek na webu
<a href="http://hdl.handle.net/11104/0295698" target="_blank" >http://hdl.handle.net/11104/0295698</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1039/C8PP00313K" target="_blank" >10.1039/C8PP00313K</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Transparent rutile TiO2 films prepared by thermal oxidation of sputtered Ti on FTO glass
Popis výsledku v původním jazyce
TiO2 films were prepared via a two-step fabrication process, i.e. deposition of Ti films by magnetron sputtering on an FTO glass substrate followed by thermal oxidation at 600–725 °C. The investigated parameters were Ti layer thickness, temperature of oxidation and deposition conditions (pre-treatment and substrate heating). Such TiO2 films have a rutile structure and contain metallic Sn which is the result of a thermal reaction at the interface between SnO2 and Ti at temperatures above 500 °C. A calcination temperature of 600 °C is optimal for fabricating TiO2 films with significant photoelectrochemical response. Heating of the FTO substrate during magnetron sputtering deposition of Ti films results in a significant improvement of the compactness of the TiO2 films. A similar but not so pronounced improvement was observed for the TiO2 films deposited on the FTO substrate pre-treated with radio-frequency plasma under Ar–O2 and N2–H2 atmosphere. The observed correlation between the increased content of Sn in the TiO2 films and compactness of the TiO2 films supports the explanation of both positive effects by better adhesion of the Ti films to the FTO substrate.n
Název v anglickém jazyce
Transparent rutile TiO2 films prepared by thermal oxidation of sputtered Ti on FTO glass
Popis výsledku anglicky
TiO2 films were prepared via a two-step fabrication process, i.e. deposition of Ti films by magnetron sputtering on an FTO glass substrate followed by thermal oxidation at 600–725 °C. The investigated parameters were Ti layer thickness, temperature of oxidation and deposition conditions (pre-treatment and substrate heating). Such TiO2 films have a rutile structure and contain metallic Sn which is the result of a thermal reaction at the interface between SnO2 and Ti at temperatures above 500 °C. A calcination temperature of 600 °C is optimal for fabricating TiO2 films with significant photoelectrochemical response. Heating of the FTO substrate during magnetron sputtering deposition of Ti films results in a significant improvement of the compactness of the TiO2 films. A similar but not so pronounced improvement was observed for the TiO2 films deposited on the FTO substrate pre-treated with radio-frequency plasma under Ar–O2 and N2–H2 atmosphere. The observed correlation between the increased content of Sn in the TiO2 films and compactness of the TiO2 films supports the explanation of both positive effects by better adhesion of the Ti films to the FTO substrate.n
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2019
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Photochemical & Photobiological Sciences
ISSN
1474-905X
e-ISSN
—
Svazek periodika
18
Číslo periodika v rámci svazku
4
Stát vydavatele periodika
FR - Francouzská republika
Počet stran výsledku
6
Strana od-do
891-896
Kód UT WoS článku
000464060500007
EID výsledku v databázi Scopus
2-s2.0-85064246775