Chem-mechanical polishing influenced morphology, spectral and electrochemical characteristics of boron doped diamond

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F23%3A00570739" target="_blank" >RIV/61388955:_____/23:00570739 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68378271:_____/23:00570739 RIV/00216208:11310/23:10452286

Výsledek na webu

<a href="https://doi.org/10.1016/j.carbon.2022.11.069" target="_blank" >https://doi.org/10.1016/j.carbon.2022.11.069</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.carbon.2022.11.069" target="_blank" >10.1016/j.carbon.2022.11.069</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Chem-mechanical polishing influenced morphology, spectral and electrochemical characteristics of boron doped diamond

Popis výsledku v původním jazyce

In this study complex characterization and comparison of as-grown and chemical-mechanical (CM) polished ultra-thin (≤500 nm) boron doped diamond (BDD) electrodes with various boron content (0.58–4.4 × 1021 cm−3, deposited with B/C 500–8000 ppm) was performed. Atomic force and scanning electron microscopy were used to compare morphological changes and confirm the reduction in roughness down to ≤2 nm. High-quality CM polishing enabled electron backscatter diffraction leading to the evaluation of grain size distribution (mean 0.3 μm) and preferred grain texture, {011}. X-ray photoelectron spectroscopy confirmed an increase in the B content on the surface of CM polished electrodes as a result of exposure of boron atoms incorporated into the bulk for highly doped BDD4000 and BDD8000 electrodes. Additionally, CM polished BDD electrodes are shown to possess uniform distribution of conductivity as proved by scanning electrochemical microscopy.

Název v anglickém jazyce

Chem-mechanical polishing influenced morphology, spectral and electrochemical characteristics of boron doped diamond

Popis výsledku anglicky

In this study complex characterization and comparison of as-grown and chemical-mechanical (CM) polished ultra-thin (≤500 nm) boron doped diamond (BDD) electrodes with various boron content (0.58–4.4 × 1021 cm−3, deposited with B/C 500–8000 ppm) was performed. Atomic force and scanning electron microscopy were used to compare morphological changes and confirm the reduction in roughness down to ≤2 nm. High-quality CM polishing enabled electron backscatter diffraction leading to the evaluation of grain size distribution (mean 0.3 μm) and preferred grain texture, {011}. X-ray photoelectron spectroscopy confirmed an increase in the B content on the surface of CM polished electrodes as a result of exposure of boron atoms incorporated into the bulk for highly doped BDD4000 and BDD8000 electrodes. Additionally, CM polished BDD electrodes are shown to possess uniform distribution of conductivity as proved by scanning electrochemical microscopy.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Carbon

ISSN

0008-6223

e-ISSN

1873-3891

Svazek periodika

203

Číslo periodika v rámci svazku

Jan

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

14

Strana od-do

363-376

Kód UT WoS článku

001017533700001

EID výsledku v databázi Scopus

2-s2.0-85143748847