Study of Cu+, Ag+ and Au+ ion implantation into silicate glasses

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F10%3A00351912" target="_blank" >RIV/61389005:_____/10:00351912 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22310/10:00022985 RIV/44555601:13440/10:00005564

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Study of Cu+, Ag+ and Au+ ion implantation into silicate glasses

Popis výsledku v původním jazyce

A study of the ion implantation of Cu+, Ag+ or Au+ ions into different types of silicate glasses is reported. The energy of the implanted ions was 330 keV and the implantation fluence was kept at 11016 cm-2. The samples were characterised by various analytical methods: Rutherford Backscattering Spectrometry for the concentration depth profiles of the implanted atoms, Raman spectroscopy for the structure of the samples and also by UV-VIS absorption spectroscopy. The obtained data were evaluated on the bases of the structure of the glass matrix and the relations between the structural changes and optical properties, important for photonics applications, were formulated. The main focus was the impact of various types and concentrations of glass network modifiers (e.g. Li, Na, K, Mg, Ca or Zn) as well as glass network formers (Si, B) on the projected range of the implanted ions.

Název v anglickém jazyce

Study of Cu+, Ag+ and Au+ ion implantation into silicate glasses

Popis výsledku anglicky

A study of the ion implantation of Cu+, Ag+ or Au+ ions into different types of silicate glasses is reported. The energy of the implanted ions was 330 keV and the implantation fluence was kept at 11016 cm-2. The samples were characterised by various analytical methods: Rutherford Backscattering Spectrometry for the concentration depth profiles of the implanted atoms, Raman spectroscopy for the structure of the samples and also by UV-VIS absorption spectroscopy. The obtained data were evaluated on the bases of the structure of the glass matrix and the relations between the structural changes and optical properties, important for photonics applications, were formulated. The main focus was the impact of various types and concentrations of glass network modifiers (e.g. Li, Na, K, Mg, Ca or Zn) as well as glass network formers (Si, B) on the projected range of the implanted ions.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Non-Crystalline Solids

ISSN

0022-3093

e-ISSN

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Svazek periodika

356

Číslo periodika v rámci svazku

44-49

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

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Kód UT WoS článku

000285282100038

EID výsledku v databázi Scopus

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