Diffusion of silver and iodine into polymers assisted by in situ electron irradiation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F14%3A00428397" target="_blank" >RIV/61389005:_____/14:00428397 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.radphyschem.2014.01.020" target="_blank" >http://dx.doi.org/10.1016/j.radphyschem.2014.01.020</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.radphyschem.2014.01.020" target="_blank" >10.1016/j.radphyschem.2014.01.020</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Diffusion of silver and iodine into polymers assisted by in situ electron irradiation

Popis výsledku v původním jazyce

Diffusion of silver and iodine from aqueous solution into three synthetic polymers, HDPE, PI, and PEEK was studied. The samples, fully immersed in the respective chemical solution, were irradiated with 6.5 MeV electrons at room temperature to fluencies from 1.0 to 5.0 x 10(15) cm(-2). Concentration depth profiles of the diffused Ag and I atoms were determined by the RBS method. The content of the silver and iodine atoms was found to be a monotonously increasing function of the diffusion time, but it does not follow dependence expected for pure Fickian diffusion. The measured depth profiles exhibit a nearly exponential form and differ significantly from what is expected for the Fickian diffusion. Moreover, on silver depth profiles, two components are observed corresponding to particles with different mobilities. The anomalies are attributed to radiation defects created by electron irradiation, which are supposed to act as effective trapping centers for the diffusing particles. The depth

Název v anglickém jazyce

Diffusion of silver and iodine into polymers assisted by in situ electron irradiation

Popis výsledku anglicky

Diffusion of silver and iodine from aqueous solution into three synthetic polymers, HDPE, PI, and PEEK was studied. The samples, fully immersed in the respective chemical solution, were irradiated with 6.5 MeV electrons at room temperature to fluencies from 1.0 to 5.0 x 10(15) cm(-2). Concentration depth profiles of the diffused Ag and I atoms were determined by the RBS method. The content of the silver and iodine atoms was found to be a monotonously increasing function of the diffusion time, but it does not follow dependence expected for pure Fickian diffusion. The measured depth profiles exhibit a nearly exponential form and differ significantly from what is expected for the Fickian diffusion. Moreover, on silver depth profiles, two components are observed corresponding to particles with different mobilities. The anomalies are attributed to radiation defects created by electron irradiation, which are supposed to act as effective trapping centers for the diffusing particles. The depth

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Radiation Physics and Chemistry

ISSN

0969-806X

e-ISSN

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Svazek periodika

98

Číslo periodika v rámci svazku

MAY

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

92-97

Kód UT WoS článku

000333796200015

EID výsledku v databázi Scopus

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