Compaction of polydimethylsiloxane due to nitrogen ion irradiation and its application for creating microlens arrays
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F17%3A00478048" target="_blank" >RIV/61389005:_____/17:00478048 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1016/j.tsf.2017.07.015" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2017.07.015</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2017.07.015" target="_blank" >10.1016/j.tsf.2017.07.015</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Compaction of polydimethylsiloxane due to nitrogen ion irradiation and its application for creating microlens arrays
Popis výsledku v původním jazyce
In this work the change in the surface topography of polydimethylsiloxane (PDMS) due to irradiation with 10.5 MeV N4(+) ion microbeam is investigated. Parallel stripes with different widths and different gaps between the stripes were irradiated. The heavy ion beam induced physical and chemical processes caused shrinkage of the irradiated structures. The degree of compaction, and its relation to the irradiation fluence and pattern was studied by means of atomic force microscopy (AFM). Exploiting the compaction effect, arrays of microlenses with different diameters were designed and fabricated in PDMS. We show that regular microlenses can be produced by the adjustment of their size and irradiation fluence. The focal length of the lenses can be tuned with the diameter of the lens and with the delivered ion fluence.
Název v anglickém jazyce
Compaction of polydimethylsiloxane due to nitrogen ion irradiation and its application for creating microlens arrays
Popis výsledku anglicky
In this work the change in the surface topography of polydimethylsiloxane (PDMS) due to irradiation with 10.5 MeV N4(+) ion microbeam is investigated. Parallel stripes with different widths and different gaps between the stripes were irradiated. The heavy ion beam induced physical and chemical processes caused shrinkage of the irradiated structures. The degree of compaction, and its relation to the irradiation fluence and pattern was studied by means of atomic force microscopy (AFM). Exploiting the compaction effect, arrays of microlenses with different diameters were designed and fabricated in PDMS. We show that regular microlenses can be produced by the adjustment of their size and irradiation fluence. The focal length of the lenses can be tuned with the diameter of the lens and with the delivered ion fluence.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10304 - Nuclear physics
Návaznosti výsledku
Projekt
<a href="/cs/project/LM2015056" target="_blank" >LM2015056: Centrum urychlovačů a jaderných analytických metod</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2017
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Thin Solid Films
ISSN
0040-6090
e-ISSN
—
Svazek periodika
636
Číslo periodika v rámci svazku
AUG
Stát vydavatele periodika
CH - Švýcarská konfederace
Počet stran výsledku
5
Strana od-do
634-638
Kód UT WoS článku
000408037800090
EID výsledku v databázi Scopus
2-s2.0-85022324605