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Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F19%3A00520686" target="_blank" >RIV/61389005:_____/19:00520686 - isvavai.cz</a>

  • Nalezeny alternativní kódy

    RIV/60461373:22310/19:43918089 RIV/44555601:13440/19:43894603

  • Výsledek na webu

    <a href="https://doi.org/10.1016/j.nimb.2019.03.022" target="_blank" >https://doi.org/10.1016/j.nimb.2019.03.022</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.nimb.2019.03.022" target="_blank" >10.1016/j.nimb.2019.03.022</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation

  • Popis výsledku v původním jazyce

    The ion irradiation fluences of 5.0 x 10(14) cm(-2), 5.0 x 10(15) cm(-2) and 5.0 x 10(16) cm(-2) were used. Upon irradiation, the modified GO foils were characterised using nuclear analytical methods Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA) and various conventional analytical methods such as Raman spectroscopy, Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR), X-ray Photoelectron Spectroscopy (XPS), and 2-point conductivity measurements. Oxygen species removal was evidenced as the increasing function of the ion implantation fluence and oxygen depth profiles exhibited complex behaviour connected to implanted ion specie. The deep oxygen depletion in the broad surface layer accompanied by Ga diffusion into the depth was observed in Ga irradiated GO compared to Au irradiated samples which exhibited a narrow oxygen depleted layer at GO surface. XPS evidenced strong increase of C=C bonds compared to C-O bonds on the irradiated GO surface with increasing ion fluence, which was comparable for both ion species. Raman spectroscopy shows the modification of main phonon modes identified in GO. The D peak slight decrease and broadening was observed for GO irradiated with ion fluence above 5 x 1015 cm(-2) and mainly for Au ion irradiation. FTIR analysis proved the oxygen containing functional group release with the increased ion fluence, mainly C-O group release after Au ion irradiation was observed. Simultaneously H-O stretching absorption peak is in FTIR spectrum reduced more significantly for Ga irradiated GO which is in accordance with RBS elemental analysis exhibiting the more pronounced hydrogen depletion. Electrical conductivity measurement shows the linear I-V characteristics for the GO irradiated using both ion species and all ion fluences, the surface layer exhibited conductive behaviour comparing to pristine GO non-linear I-V characteristics.

  • Název v anglickém jazyce

    Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation

  • Popis výsledku anglicky

    The ion irradiation fluences of 5.0 x 10(14) cm(-2), 5.0 x 10(15) cm(-2) and 5.0 x 10(16) cm(-2) were used. Upon irradiation, the modified GO foils were characterised using nuclear analytical methods Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA) and various conventional analytical methods such as Raman spectroscopy, Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR), X-ray Photoelectron Spectroscopy (XPS), and 2-point conductivity measurements. Oxygen species removal was evidenced as the increasing function of the ion implantation fluence and oxygen depth profiles exhibited complex behaviour connected to implanted ion specie. The deep oxygen depletion in the broad surface layer accompanied by Ga diffusion into the depth was observed in Ga irradiated GO compared to Au irradiated samples which exhibited a narrow oxygen depleted layer at GO surface. XPS evidenced strong increase of C=C bonds compared to C-O bonds on the irradiated GO surface with increasing ion fluence, which was comparable for both ion species. Raman spectroscopy shows the modification of main phonon modes identified in GO. The D peak slight decrease and broadening was observed for GO irradiated with ion fluence above 5 x 1015 cm(-2) and mainly for Au ion irradiation. FTIR analysis proved the oxygen containing functional group release with the increased ion fluence, mainly C-O group release after Au ion irradiation was observed. Simultaneously H-O stretching absorption peak is in FTIR spectrum reduced more significantly for Ga irradiated GO which is in accordance with RBS elemental analysis exhibiting the more pronounced hydrogen depletion. Electrical conductivity measurement shows the linear I-V characteristics for the GO irradiated using both ion species and all ion fluences, the surface layer exhibited conductive behaviour comparing to pristine GO non-linear I-V characteristics.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    20305 - Nuclear related engineering; (nuclear physics to be 1.3);

Návaznosti výsledku

  • Projekt

    Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

  • Návaznosti

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Ostatní

  • Rok uplatnění

    2019

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Nuclear Instruments & Methods in Physics Research Section B

  • ISSN

    0168-583X

  • e-ISSN

  • Svazek periodika

    460

  • Číslo periodika v rámci svazku

    12

  • Stát vydavatele periodika

    NL - Nizozemsko

  • Počet stran výsledku

    8

  • Strana od-do

    201-208

  • Kód UT WoS článku

    000504510900038

  • EID výsledku v databázi Scopus

    2-s2.0-85063099323