Ion Track Etching Revisited: Influence of Aging on Parameters of Irradiated Polymers as Required for Advanced Devices

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F20%3A00538800" target="_blank" >RIV/61389005:_____/20:00538800 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1007/978-94-024-2030-2_10" target="_blank" >http://dx.doi.org/10.1007/978-94-024-2030-2_10</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/978-94-024-2030-2_10" target="_blank" >10.1007/978-94-024-2030-2_10</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Ion Track Etching Revisited: Influence of Aging on Parameters of Irradiated Polymers as Required for Advanced Devices

Popis výsledku v původním jazyce

Aging of polymers might contribute to possible malfunction of devices based on them, such as biosensors and others. As hitherto still little is known about the influence of aging on pristine and swift heavy ion-irradiated polymer foils, we had recently started with the re-examination of the etching behaviour and the electronic properties of such materials, which had been subjected to ageing for up to ∼20 years. For this sake, we correlated the as-measured and normalized onset times of etching and etching speeds of the various etching stages with each other. As expected, the sample aging affects the magnitude of these parameters. Surprisingly, this aging effect also differs on both sides of a given sample. The etching parameters were found to correlate not only with both the thickness and the surface roughness of the examined foil samples, but also with the fluence during the ion irradiation. All these effects can be understood easily within a consistent model. As for some examinations, very long etching times were required, the question arose how interruptions during the track etching procedure might affect the final result. In the appendix it is shown that transient sample drying is the safest way to avoid disturbances or falsifications of the measurements.

Název v anglickém jazyce

Ion Track Etching Revisited: Influence of Aging on Parameters of Irradiated Polymers as Required for Advanced Devices

Popis výsledku anglicky

Aging of polymers might contribute to possible malfunction of devices based on them, such as biosensors and others. As hitherto still little is known about the influence of aging on pristine and swift heavy ion-irradiated polymer foils, we had recently started with the re-examination of the etching behaviour and the electronic properties of such materials, which had been subjected to ageing for up to ∼20 years. For this sake, we correlated the as-measured and normalized onset times of etching and etching speeds of the various etching stages with each other. As expected, the sample aging affects the magnitude of these parameters. Surprisingly, this aging effect also differs on both sides of a given sample. The etching parameters were found to correlate not only with both the thickness and the surface roughness of the examined foil samples, but also with the fluence during the ion irradiation. All these effects can be understood easily within a consistent model. As for some examinations, very long etching times were required, the question arose how interruptions during the track etching procedure might affect the final result. In the appendix it is shown that transient sample drying is the safest way to avoid disturbances or falsifications of the measurements.

Druh

C - Kapitola v odborné knize

CEP obor

—

OECD FORD obor

10404 - Polymer science

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

NATO Science for Peace and Security Series A: Chemistry and Biology

ISBN

978-94-024-2029-6

Počet stran výsledku

22

Strana od-do

149-170

Počet stran knihy

354

Název nakladatele

Springer Nature

Místo vydání

Dordrecht

Kód UT WoS kapitoly

—