Ni-Au layers on sapphire prepared by direct current magnetron sputtering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F22%3A00563460" target="_blank" >RIV/61389005:_____/22:00563460 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/44555601:13440/22:43897095

Výsledek na webu

<a href="https://doi.org/10.1080/10420150.2022.2136091" target="_blank" >https://doi.org/10.1080/10420150.2022.2136091</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1080/10420150.2022.2136091" target="_blank" >10.1080/10420150.2022.2136091</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Ni-Au layers on sapphire prepared by direct current magnetron sputtering

Popis výsledku v původním jazyce

Thin bimetallic Ni-Au layers (similar to 100 nm) with three different Au content were prepared by direct current magnetron sputtering onto sapphire substrates. The elemental composition and the layer thickness of bimetallic layers were controlled during the sputtering process. The prepared Ni-Au layers were annealed at temperatures of 400 degrees C and 900 degrees C in the air to determine the behavior of Au and Ni in the layers after heating. The elemental composition and depth profiling was provided by Rutherford backscattering spectrometry (RBS). The surface morphology was examined via Scanning electron microscopy (SEM). RBS measurement revealed inter-diffusion Au into sapphire substrate after thermal annealing and the formation of grains and voids.

Název v anglickém jazyce

Ni-Au layers on sapphire prepared by direct current magnetron sputtering

Popis výsledku anglicky

Thin bimetallic Ni-Au layers (similar to 100 nm) with three different Au content were prepared by direct current magnetron sputtering onto sapphire substrates. The elemental composition and the layer thickness of bimetallic layers were controlled during the sputtering process. The prepared Ni-Au layers were annealed at temperatures of 400 degrees C and 900 degrees C in the air to determine the behavior of Au and Ni in the layers after heating. The elemental composition and depth profiling was provided by Rutherford backscattering spectrometry (RBS). The surface morphology was examined via Scanning electron microscopy (SEM). RBS measurement revealed inter-diffusion Au into sapphire substrate after thermal annealing and the formation of grains and voids.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Projekt

<a href="/cs/project/EF16_013%2F0001812" target="_blank" >EF16_013/0001812: Centrum urychlovačů a jaderných analytických metod - OP</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Radiation Effects and Defects in Solids

ISSN

1042-0150

e-ISSN

1029-4953

Svazek periodika

177

Číslo periodika v rámci svazku

11-12

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

12

Strana od-do

1288-1299

Kód UT WoS článku

000870601000001

EID výsledku v databázi Scopus

2-s2.0-85140344693