In-Situ Neutron Depth Profiling Studies (Measurements and Simulations) to Characterize the Surface of Silicon Anodes and Complementary Neutron Techniques for in-Situ and Operando Characterization

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F24%3A00647037" target="_blank" >RIV/61389005:_____/24:00647037 - isvavai.cz</a>

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1149/MA2024-02604058mtgabs" target="_blank" >https://iopscience.iop.org/article/10.1149/MA2024-02604058mtgabs</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

In-Situ Neutron Depth Profiling Studies (Measurements and Simulations) to Characterize the Surface of Silicon Anodes and Complementary Neutron Techniques for in-Situ and Operando Characterization

Popis výsledku v původním jazyce

In-situ methods for characterizing electrochemical systems are becoming increasingly important to understand the mechanism of lithiation and delithiation processes. The characterization of surfaces that have been under electrochemical influence is of great interest because many electrochemical processes originate here and are therefore crucial for cell performance. Pure silicon anodes with their large volume expansion, which leads to a short service life, can be modified at WACKER company by partial lithiation of microscale silicon particles. Such anode types promise higher specific capacity. Neutron depth profiling (NDP) is a very well suitable technique to study the Li quantity with depth dependence on the first micrometers. The NDP method uses the capture reaction of Li atoms and neutrons with subsequent decay into ions of well-defined energies. The depth at which ions are created in the material is defined from their energy loss through the material to the detector with an accuracy of tens of nanometers. After formation different lithiation stages of SiG anodes are presented and compared with simulations. The lithiation process involving SEI formation, electrode swelling and phase transformation from crystalline to amorphous is presented. In the second part, a brief overview of other neutron techniques for in-situ and operando characterization of individual battery components or entire cells is given.

Název v anglickém jazyce

In-Situ Neutron Depth Profiling Studies (Measurements and Simulations) to Characterize the Surface of Silicon Anodes and Complementary Neutron Techniques for in-Situ and Operando Characterization

Popis výsledku anglicky

In-situ methods for characterizing electrochemical systems are becoming increasingly important to understand the mechanism of lithiation and delithiation processes. The characterization of surfaces that have been under electrochemical influence is of great interest because many electrochemical processes originate here and are therefore crucial for cell performance. Pure silicon anodes with their large volume expansion, which leads to a short service life, can be modified at WACKER company by partial lithiation of microscale silicon particles. Such anode types promise higher specific capacity. Neutron depth profiling (NDP) is a very well suitable technique to study the Li quantity with depth dependence on the first micrometers. The NDP method uses the capture reaction of Li atoms and neutrons with subsequent decay into ions of well-defined energies. The depth at which ions are created in the material is defined from their energy loss through the material to the detector with an accuracy of tens of nanometers. After formation different lithiation stages of SiG anodes are presented and compared with simulations. The lithiation process involving SEI formation, electrode swelling and phase transformation from crystalline to amorphous is presented. In the second part, a brief overview of other neutron techniques for in-situ and operando characterization of individual battery components or entire cells is given.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů