Kinetika opticky a tepelně indukované difúze a rozpouštění stříbra v napařených tenkých amorfních vrstvách As33S33.5Se33.5: jejich vlastnosti a struktura

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F06%3A00047025" target="_blank" >RIV/61389013:_____/06:00047025 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Kinetics of optically - and thermally - induced diffusion and dissolution of silver in evaporated As33S33.5Se33.5 amorphous films: their properties and structure

Popis výsledku v původním jazyce

As33S33.5Se33.5 amorphous films were prepared by the vacuum thermal evaporation technique. Silver film was also deposited on top of As33S33.5Se33.5 film by the same technique. The films with known silver concentration and good optical quality were prepared by step-by-step optically - and thermally - induced diffusion and dissolution. The range of silver concentration was 0-25 at %.Rutherford backscattering spectroscopy was used for obtaining silver depth profiles. Composition and microanalysis of reaction products have been determined by an electron scanning microscope and energy dispersive x-ray microanalyser. Optical properties of thin films were observed and calculated by the Swanepoel method. Raman spectroscopy was used to establish films structure.

Název v anglickém jazyce

Kinetics of optically - and thermally - induced diffusion and dissolution of silver in evaporated As33S33.5Se33.5 amorphous films: their properties and structure

Popis výsledku anglicky

As33S33.5Se33.5 amorphous films were prepared by the vacuum thermal evaporation technique. Silver film was also deposited on top of As33S33.5Se33.5 film by the same technique. The films with known silver concentration and good optical quality were prepared by step-by-step optically - and thermally - induced diffusion and dissolution. The range of silver concentration was 0-25 at %.Rutherford backscattering spectroscopy was used for obtaining silver depth profiles. Composition and microanalysis of reaction products have been determined by an electron scanning microscope and energy dispersive x-ray microanalyser. Optical properties of thin films were observed and calculated by the Swanepoel method. Raman spectroscopy was used to establish films structure.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CA - Anorganická chemie

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2006

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physics and Chemistry of Glasses

ISSN

0031-9090

e-ISSN

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Svazek periodika

2

Číslo periodika v rámci svazku

47

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

5

Strana od-do

193-197

Kód UT WoS článku

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EID výsledku v databázi Scopus

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