Image plane digital holographic microscope for the inspection of ferroelectric single crystals.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F16%3A00469206" target="_blank" >RIV/61389021:_____/16:00469206 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1117/1.OE.55.12.121731" target="_blank" >http://dx.doi.org/10.1117/1.OE.55.12.121731</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/1.OE.55.12.121731" target="_blank" >10.1117/1.OE.55.12.121731</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Image plane digital holographic microscope for the inspection of ferroelectric single crystals.

Popis výsledku v původním jazyce

One of the most important characteristics in the research and application of ferroelectric materials is the appearance of the domain patterns, which take place in phenomena such as ferroelectric phase transitions or ferroelectric switching. The ability to visualize domains is the key factor that enables the progress in the research of these extremely interesting phenomena. However, the three-dimensional visualization of the ferroelectric domain patterns in the whole volume of the ferroelectric single crystal is not a straightforward task. We present the optical method, which allows the acquisition of quantitative and qualitative data substantial for the ferroelectric domain research. The principle of the method is based on image plane digital holographic microscopy (DHM). We used DHM setup outcomes from a Mach–Zehnder type of interferometer and phase-shifting digital holography. The studied specimen is a single crystal of barium titanate. It is demonstrated that the use of solidstate thin-film transparent electrodes of indium tin oxide greatly reduces the unwanted wavefront distortions, which are frequently produced in liquid electrodes. Using this approach, it is possible to greatly improve the DHM measurements in low applied electric fields. Thanks to the properties of the setup, real-time observation of domain walls growth or existing patterns of the ferroelectric crystal is possible.

Název v anglickém jazyce

Image plane digital holographic microscope for the inspection of ferroelectric single crystals.

Popis výsledku anglicky

One of the most important characteristics in the research and application of ferroelectric materials is the appearance of the domain patterns, which take place in phenomena such as ferroelectric phase transitions or ferroelectric switching. The ability to visualize domains is the key factor that enables the progress in the research of these extremely interesting phenomena. However, the three-dimensional visualization of the ferroelectric domain patterns in the whole volume of the ferroelectric single crystal is not a straightforward task. We present the optical method, which allows the acquisition of quantitative and qualitative data substantial for the ferroelectric domain research. The principle of the method is based on image plane digital holographic microscopy (DHM). We used DHM setup outcomes from a Mach–Zehnder type of interferometer and phase-shifting digital holography. The studied specimen is a single crystal of barium titanate. It is demonstrated that the use of solidstate thin-film transparent electrodes of indium tin oxide greatly reduces the unwanted wavefront distortions, which are frequently produced in liquid electrodes. Using this approach, it is possible to greatly improve the DHM measurements in low applied electric fields. Thanks to the properties of the setup, real-time observation of domain walls growth or existing patterns of the ferroelectric crystal is possible.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA14-32228S" target="_blank" >GA14-32228S: Digitální holografická tomografie feroelektrických doménových stěn</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optical Engineering

ISSN

0091-3286

e-ISSN

—

Svazek periodika

55

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

—

Kód UT WoS článku

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EID výsledku v databázi Scopus

2-s2.0-84996503305