Subaperture stitching computation time optimization using a system of linear equations

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F21%3A00569037" target="_blank" >RIV/61389021:_____/21:00569037 - isvavai.cz</a>

Výsledek na webu

<a href="https://opg.optica.org/ao/viewmedia.cfm?uri=ao-60-27-8556&seq=0" target="_blank" >https://opg.optica.org/ao/viewmedia.cfm?uri=ao-60-27-8556&seq=0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/AO.433312" target="_blank" >10.1364/AO.433312</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Subaperture stitching computation time optimization using a system of linear equations

Popis výsledku v původním jazyce

Measurement of large or aspheric optical surface shapes as a single aperture using interferometry is problematic for many reasons. A typical problem is the numerical aperture limitation of the interferometer transmission element and the surface slope deviation of aspheres. This deviation typically causes vignetting and spatial aliasing on the camera. A solution is subaperture measurement and subsequent subaperture stitching. A stitching algorithm, in principle, uses overlaps between subapertures to eliminate aberrations of each subaperture to obtain a full aperture for further analysis. This process is computation time demanding and requires optimization in order to obtain a result in a reasonable time to reduce, in turn, the overall manufacturing time. In this paper, a novel, to the best of our knowledge, and fast stitching method based on a system of linear equations is proposed and mathematically described. The developed method was compared with other algorithms, and theoretical computation complexity was calculated and compared. The method was tested practically, with real data measured on spherical surfaces using QED ASI (QED Technologies aspheric stitching interferometer) and an experimental interferometer, and the results are presented. Stitching quality was quantified for results and compared to other algorithms.

Název v anglickém jazyce

Subaperture stitching computation time optimization using a system of linear equations

Popis výsledku anglicky

Measurement of large or aspheric optical surface shapes as a single aperture using interferometry is problematic for many reasons. A typical problem is the numerical aperture limitation of the interferometer transmission element and the surface slope deviation of aspheres. This deviation typically causes vignetting and spatial aliasing on the camera. A solution is subaperture measurement and subsequent subaperture stitching. A stitching algorithm, in principle, uses overlaps between subapertures to eliminate aberrations of each subaperture to obtain a full aperture for further analysis. This process is computation time demanding and requires optimization in order to obtain a result in a reasonable time to reduce, in turn, the overall manufacturing time. In this paper, a novel, to the best of our knowledge, and fast stitching method based on a system of linear equations is proposed and mathematically described. The developed method was compared with other algorithms, and theoretical computation complexity was calculated and compared. The method was tested practically, with real data measured on spherical surfaces using QED ASI (QED Technologies aspheric stitching interferometer) and an experimental interferometer, and the results are presented. Stitching quality was quantified for results and compared to other algorithms.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/EF16_026%2F0008390" target="_blank" >EF16_026/0008390: Partnerství pro excelenci v superpřesné optice</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Optics

ISSN

1559-128X

e-ISSN

2155-3165

Svazek periodika

60

Číslo periodika v rámci svazku

27

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

13

Strana od-do

8556-8568

Kód UT WoS článku

000698504300043

EID výsledku v databázi Scopus

2-s2.0-85115263599