On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00574767" target="_blank" >RIV/61389021:_____/23:00574767 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/46747885:24220/23:00011122

Výsledek na webu

<a href="https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-11-17185&id=530478" target="_blank" >https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-11-17185&id=530478</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.486997" target="_blank" >10.1364/OE.486997</a>

Jazyk výsledku

angličtina

Název v původním jazyce

On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples

Popis výsledku v původním jazyce

This paper describes on-chip digital holographic interferometry for measuring the wavefront deformation of transparent samples. The interferometer is based on a Mach-Zehnder arrangement with a waveguide in the reference arm, which allows for a compact on-chip arrangement. The method thus exploits the sensitivity of digital holographic interferometry and the advantages of the on-chip approach, which provides high spatial resolution over a large area, simplicity, and compactness of the system. The method's performance is demonstrated by measuring a model glass sample fabricated by depositing SiO2 layers of different thicknesses on a planar glass substrate and visualizing the domain structure in periodically poled lithium niobate. Finally, the results of the measurement made with the on-chip digital holographic interferometer were compared with those made with a conventional Mach-Zehnder type digital holographic interferometer with lens and with a commercial white light interferometer. The comparison of the obtained results indicates that the on-chip digital holographic interferometer provides accuracy comparable to conventional methods while offering the benefits of a large field of view and simplicity.

Název v anglickém jazyce

On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples

Popis výsledku anglicky

This paper describes on-chip digital holographic interferometry for measuring the wavefront deformation of transparent samples. The interferometer is based on a Mach-Zehnder arrangement with a waveguide in the reference arm, which allows for a compact on-chip arrangement. The method thus exploits the sensitivity of digital holographic interferometry and the advantages of the on-chip approach, which provides high spatial resolution over a large area, simplicity, and compactness of the system. The method's performance is demonstrated by measuring a model glass sample fabricated by depositing SiO2 layers of different thicknesses on a planar glass substrate and visualizing the domain structure in periodically poled lithium niobate. Finally, the results of the measurement made with the on-chip digital holographic interferometer were compared with those made with a conventional Mach-Zehnder type digital holographic interferometer with lens and with a commercial white light interferometer. The comparison of the obtained results indicates that the on-chip digital holographic interferometer provides accuracy comparable to conventional methods while offering the benefits of a large field of view and simplicity.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Express

ISSN

1094-4087

e-ISSN

—

Svazek periodika

31

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

16

Strana od-do

17185-17200

Kód UT WoS článku

001012041500004

EID výsledku v databázi Scopus

2-s2.0-85163164021