Single-pixel hyperspectral photoluminescence tomography of optical materials

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F25%3A00648115" target="_blank" >RIV/61389021:_____/25:00648115 - isvavai.cz</a>

Výsledek na webu

<a href="https://opg.optica.org/ao/abstract.cfm?uri=ao-64-35-10497" target="_blank" >https://opg.optica.org/ao/abstract.cfm?uri=ao-64-35-10497</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/AO.578657" target="_blank" >10.1364/AO.578657</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Single-pixel hyperspectral photoluminescence tomography of optical materials

Popis výsledku v původním jazyce

Three-dimensional photoluminescence (PL) imaging at micrometer scales is essential for characterizing defects in optical materials. However, conventional scanning systems suffer from prohibitively long acquisition times when measuring weak PL signals from defects. We present a novel 3D compressive imaging technique, to our knowledge, that extends single-pixel camera principles to volumetric PL tomography, achieving three-dimensional reconstruction with micrometer-scale depth resolution. This is enabled by a set of unique 3D speckle patterns generated near the focal plane of a lens, exploiting their rapid decorrelation in the near-field diffraction regime. Theoretical analysis confirms that the depth resolution follows conventional depth of field scaling laws while enabling simultaneous acquisition of entire 3D datasets. We demonstrate the method’s capability using Ce-doped luminophore plates, successfully distinguishing multiple PL sources within the same volume and accurately tracking their positions along the laser beam. The approach offers significant potential for studying bulk and surface defects in optical materials.

Název v anglickém jazyce

Single-pixel hyperspectral photoluminescence tomography of optical materials

Popis výsledku anglicky

Three-dimensional photoluminescence (PL) imaging at micrometer scales is essential for characterizing defects in optical materials. However, conventional scanning systems suffer from prohibitively long acquisition times when measuring weak PL signals from defects. We present a novel 3D compressive imaging technique, to our knowledge, that extends single-pixel camera principles to volumetric PL tomography, achieving three-dimensional reconstruction with micrometer-scale depth resolution. This is enabled by a set of unique 3D speckle patterns generated near the focal plane of a lens, exploiting their rapid decorrelation in the near-field diffraction regime. Theoretical analysis confirms that the depth resolution follows conventional depth of field scaling laws while enabling simultaneous acquisition of entire 3D datasets. We demonstrate the method’s capability using Ce-doped luminophore plates, successfully distinguishing multiple PL sources within the same volume and accurately tracking their positions along the laser beam. The approach offers significant potential for studying bulk and surface defects in optical materials.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/GA22-09296S" target="_blank" >GA22-09296S: Tomografie defektů v optických materiálech 3D strukturovaným světlem</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Optics

ISSN

1559-128X

e-ISSN

2155-3165

Svazek periodika

64

Číslo periodika v rámci svazku

35

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

10497-10504

Kód UT WoS článku

001637023700006

EID výsledku v databázi Scopus

2-s2.0-105029265039