Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27230%2F19%3A10241992" target="_blank" >RIV/61989100:27230/19:10241992 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27240/19:10241992

Výsledek na webu

<a href="https://www.osapublishing.org/ome/abstract.cfm?uri=ome-9-3-992" target="_blank" >https://www.osapublishing.org/ome/abstract.cfm?uri=ome-9-3-992</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OME.9.000992" target="_blank" >10.1364/OME.9.000992</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Popis výsledku v původním jazyce

We report on a new method for measuring the wavelength dependence of the complex permittivity of a thin gold film of a surface plasmon resonance (SPR) structure comprising a gold-coated SF10 slide with an adhesion film of chromium attached to an SF10 glass prism. The method is based on spectral interferometry and utilizes a setup with a birefringent crystal and the SPR structure in the Kretschmann configuration, in which channeled spectra are recorded and from them, the phase functions of the SPR for air at different angles of incidence are retrieved. The SPR phenomenon is manifested as an abrupt phase change with respect to the reference phase difference for the interference resolved with the SF10 glass prism alone. The phase changes for different angles of incidence are processed in the vicinity of the resonance wavelengths to obtain the real and imaginary parts of the complex permittivity in a wavelength range from 530 to 850 nm or equivalently, the parameters of a modified Drude-Lorentz model. This research, to the best of the authors&apos; knowledge, is the first demonstration of spectral interferometry-based measurement of the complex permittivity function of a thin metal film, which is important from the point of view of material characterization directly performed in the Kretschmann configuration.

Název v anglickém jazyce

Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Popis výsledku anglicky

We report on a new method for measuring the wavelength dependence of the complex permittivity of a thin gold film of a surface plasmon resonance (SPR) structure comprising a gold-coated SF10 slide with an adhesion film of chromium attached to an SF10 glass prism. The method is based on spectral interferometry and utilizes a setup with a birefringent crystal and the SPR structure in the Kretschmann configuration, in which channeled spectra are recorded and from them, the phase functions of the SPR for air at different angles of incidence are retrieved. The SPR phenomenon is manifested as an abrupt phase change with respect to the reference phase difference for the interference resolved with the SF10 glass prism alone. The phase changes for different angles of incidence are processed in the vicinity of the resonance wavelengths to obtain the real and imaginary parts of the complex permittivity in a wavelength range from 530 to 850 nm or equivalently, the parameters of a modified Drude-Lorentz model. This research, to the best of the authors&apos; knowledge, is the first demonstration of spectral interferometry-based measurement of the complex permittivity function of a thin metal film, which is important from the point of view of material characterization directly performed in the Kretschmann configuration.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/EF17_048%2F0007399" target="_blank" >EF17_048/0007399: Nové kompozitní materiály pro environmentální aplikace</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optical Materials Express

ISSN

2159-3930

e-ISSN

—

Svazek periodika

9

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

992-1001

Kód UT WoS článku

000460134500005

EID výsledku v databázi Scopus

2-s2.0-85061605589