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Analysis of EMC Factors on Electronic Devices Using PLS-SEM Method: A Case Study in Vietnam

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F23%3A10253817" target="_blank" >RIV/61989100:27240/23:10253817 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://www.mdpi.com/2076-3417/13/2/1005" target="_blank" >https://www.mdpi.com/2076-3417/13/2/1005</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/app13021005" target="_blank" >10.3390/app13021005</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Analysis of EMC Factors on Electronic Devices Using PLS-SEM Method: A Case Study in Vietnam

  • Popis výsledku v původním jazyce

    Electronic equipment is indispensable in the industrial 4.0 era. Electromagnetic Compatibility issues with electronic devices are increasingly concerning. The phenomenon of electromagnetic field compatibility is getting higher and higher. The operating quality of electronic equipment is more and more adversely affected, such as by the phenomenon of hesitation in operation for the operating structures, the generation of fire and explosion of electrical equipment, the loss of information, and many other negative effects. This paper discusses the relationship between Electromagnetic Compatibility (EMC) scoring, Electromagnetic Interference (EMI) scoring, and Electromagnetic Susceptibility (EMS) scoring with the performance quality of electronic devices (QUA). We perform reviews on regulatory institutions governing Electromagnetic Compatibility on electronic devices. To evaluate the proposed Electromagnetic Compatibility structure and its relationship to electronic devices, we proposed to use the Partial Least Squares Structural Equation Modeling (PLS-SEM) method. The research results of the model show that the electronic device layout conditions and the lack of systematic conditions have a negative impact on the operating quality of the electronic equipment, while the conditions on equipment techniques, scientific and technological resources have positive and significant impacts.

  • Název v anglickém jazyce

    Analysis of EMC Factors on Electronic Devices Using PLS-SEM Method: A Case Study in Vietnam

  • Popis výsledku anglicky

    Electronic equipment is indispensable in the industrial 4.0 era. Electromagnetic Compatibility issues with electronic devices are increasingly concerning. The phenomenon of electromagnetic field compatibility is getting higher and higher. The operating quality of electronic equipment is more and more adversely affected, such as by the phenomenon of hesitation in operation for the operating structures, the generation of fire and explosion of electrical equipment, the loss of information, and many other negative effects. This paper discusses the relationship between Electromagnetic Compatibility (EMC) scoring, Electromagnetic Interference (EMI) scoring, and Electromagnetic Susceptibility (EMS) scoring with the performance quality of electronic devices (QUA). We perform reviews on regulatory institutions governing Electromagnetic Compatibility on electronic devices. To evaluate the proposed Electromagnetic Compatibility structure and its relationship to electronic devices, we proposed to use the Partial Least Squares Structural Equation Modeling (PLS-SEM) method. The research results of the model show that the electronic device layout conditions and the lack of systematic conditions have a negative impact on the operating quality of the electronic equipment, while the conditions on equipment techniques, scientific and technological resources have positive and significant impacts.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    20201 - Electrical and electronic engineering

Návaznosti výsledku

  • Projekt

  • Návaznosti

    S - Specificky vyzkum na vysokych skolach

Ostatní

  • Rok uplatnění

    2023

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Applied Sciences

  • ISSN

    2076-3417

  • e-ISSN

    2076-3417

  • Svazek periodika

    13

  • Číslo periodika v rámci svazku

    2

  • Stát vydavatele periodika

    CH - Švýcarská konfederace

  • Počet stran výsledku

    27

  • Strana od-do

  • Kód UT WoS článku

    000914372200001

  • EID výsledku v databázi Scopus