Aplikace disperzní spektrální interferometrie v bílém světle v optice

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F06%3A00016821" target="_blank" >RIV/61989100:27350/06:00016821 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Applications of dispersive white-light spectral interferometry in optics

Popis výsledku v původním jazyce

Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or thechromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films. The technique, which needs phase retrieving procedure to be applied in p

Název v anglickém jazyce

Applications of dispersive white-light spectral interferometry in optics

Popis výsledku anglicky

Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or thechromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films. The technique, which needs phase retrieving procedure to be applied in p

Druh

D - Stať ve sborníku

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F03%2F0776" target="_blank" >GA202/03/0776: Magnetooptické jevy v magnetických nanostrukturách</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2006

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE

ISBN

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ISSN

0277-786X

e-ISSN

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Počet stran výsledku

8

Strana od-do

615803-615803

Název nakladatele

SPIE-The International Society for Optical Engineering

Místo vydání

Bellingham

Místo konání akce

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Datum konání akce

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Typ akce podle státní příslušnosti

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Kód UT WoS článku

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