Semiconductor-based plasmonic interferometers for ultrasensitive sensing in a terahertz regime

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F17%3A10236992" target="_blank" >RIV/61989100:27640/17:10236992 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27740/17:10236992

Výsledek na webu

<a href="https://www.osapublishing.org/ol/viewmedia.cfm?uri=ol-42-12-2338&seq=0" target="_blank" >https://www.osapublishing.org/ol/viewmedia.cfm?uri=ol-42-12-2338&seq=0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OL.42.002338" target="_blank" >10.1364/OL.42.002338</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Semiconductor-based plasmonic interferometers for ultrasensitive sensing in a terahertz regime

Popis výsledku v původním jazyce

A robust plasmonic semiconductor-based Mach-Zehnder interferometer (MZI), which consists of a semiconductor layer with a microslit flanked by two identical microgrooves, is proposed and investigated for the terahertz sensing. The microgrooves reflect the surface plasmon polariton waves toward the microslit, where they interfere with the transmitted terahertz wave. The interference pattern is determined by the permittivities of the sensing material and semiconductor (i.e., temperature dependent), making the structure useful for the refractive index (RI) and temperature detection. A quantitative theoretical model is also developed for performance prediction and validated with a finite element method. The numerical results show that the Mach-Zehnder interferometer sensor possesses an RI sensitivity as high as 140000 nm/RIU (or 0.42 THz/RIU) and a relative intensity sensitivity of 1200% RIU-1. In addition, a temperature sensitivity of 1470 nm/K (or 4.7 x 10(-3) THz/K) is determined. Theoretical calculations indicate that the further improvement in sensing performance is still possible through optimization of the structure. The proposed sensing scheme may pave the way for applications in terahertz sensing and integrated terahertz circuits. (C) 2017 Optical Society of America

Název v anglickém jazyce

Semiconductor-based plasmonic interferometers for ultrasensitive sensing in a terahertz regime

Popis výsledku anglicky

A robust plasmonic semiconductor-based Mach-Zehnder interferometer (MZI), which consists of a semiconductor layer with a microslit flanked by two identical microgrooves, is proposed and investigated for the terahertz sensing. The microgrooves reflect the surface plasmon polariton waves toward the microslit, where they interfere with the transmitted terahertz wave. The interference pattern is determined by the permittivities of the sensing material and semiconductor (i.e., temperature dependent), making the structure useful for the refractive index (RI) and temperature detection. A quantitative theoretical model is also developed for performance prediction and validated with a finite element method. The numerical results show that the Mach-Zehnder interferometer sensor possesses an RI sensitivity as high as 140000 nm/RIU (or 0.42 THz/RIU) and a relative intensity sensitivity of 1200% RIU-1. In addition, a temperature sensitivity of 1470 nm/K (or 4.7 x 10(-3) THz/K) is determined. Theoretical calculations indicate that the further improvement in sensing performance is still possible through optimization of the structure. The proposed sensing scheme may pave the way for applications in terahertz sensing and integrated terahertz circuits. (C) 2017 Optical Society of America

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/GA15-21547S" target="_blank" >GA15-21547S: Charakterizace magnetických nanostruktur optickými metodami</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Letters

ISSN

0146-9592

e-ISSN

—

Svazek periodika

42

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

4

Strana od-do

2338-2341

Kód UT WoS článku

000403536800025

EID výsledku v databázi Scopus

2-s2.0-85020924613