Mueller matrix ellipsometric study of multilayer spin-VCSEL structures with local optical anisotropy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F18%3A10238972" target="_blank" >RIV/61989100:27640/18:10238972 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27740/18:10238972

Výsledek na webu

<a href="https://aip.scitation.org/doi/10.1063/1.5009411" target="_blank" >https://aip.scitation.org/doi/10.1063/1.5009411</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.5009411" target="_blank" >10.1063/1.5009411</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Mueller matrix ellipsometric study of multilayer spin-VCSEL structures with local optical anisotropy

Popis výsledku v původním jazyce

Spin-laser structures such as spin-polarized vertical-cavity surface-emitting lasers are semiconductor devices in which the radiative recombination processes involving spin-polarized carriers result in an emission of circularly polarized photons. Nevertheless, additional linear in-plane anisotropies in the cavity, e.g., interfacial and surface anisotropies, generally lead to preferential linearly polarized laser emission and to possible coupling between modes. We present Mueller matrix ellipsometric study of non-intentionally doped InGaAs/GaAsP laser structures devoted for optical pumping operations in the spectral range from 0.73 to 6.4eV in order to disentangle surface and quantum wells contributions to the linear optical birefringence of the structures. The measurement of full 4 x 4 Mueller matrix for multiple angles of incidence and in-plane azimuthal angles in combination with proper parametrization of optical functions has been used for extraction of optical permittivity tensor components along [110] and [1-10] crystal axis of surface strained layers and quantum wells grown on [001]-substrate. Such spectral dependence of optical tensor elements is crucial for modeling of spin-laser eigenmodes, resonance conditions, and also for understanding of sources of structure anisotropies.

Název v anglickém jazyce

Mueller matrix ellipsometric study of multilayer spin-VCSEL structures with local optical anisotropy

Popis výsledku anglicky

Spin-laser structures such as spin-polarized vertical-cavity surface-emitting lasers are semiconductor devices in which the radiative recombination processes involving spin-polarized carriers result in an emission of circularly polarized photons. Nevertheless, additional linear in-plane anisotropies in the cavity, e.g., interfacial and surface anisotropies, generally lead to preferential linearly polarized laser emission and to possible coupling between modes. We present Mueller matrix ellipsometric study of non-intentionally doped InGaAs/GaAsP laser structures devoted for optical pumping operations in the spectral range from 0.73 to 6.4eV in order to disentangle surface and quantum wells contributions to the linear optical birefringence of the structures. The measurement of full 4 x 4 Mueller matrix for multiple angles of incidence and in-plane azimuthal angles in combination with proper parametrization of optical functions has been used for extraction of optical permittivity tensor components along [110] and [1-10] crystal axis of surface strained layers and quantum wells grown on [001]-substrate. Such spectral dependence of optical tensor elements is crucial for modeling of spin-laser eigenmodes, resonance conditions, and also for understanding of sources of structure anisotropies.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Physics Letters

ISSN

0003-6951

e-ISSN

—

Svazek periodika

112

Číslo periodika v rámci svazku

22

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

221106

Kód UT WoS článku

000433963500006

EID výsledku v databázi Scopus

2-s2.0-85048049670