The Role of Atomic Force Microscopy in Nanoparticle Research

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F10%3A10211985" target="_blank" >RIV/61989592:15310/10:10211985 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

The Role of Atomic Force Microscopy in Nanoparticle Research

Popis výsledku v původním jazyce

Nanoparticles include any type of a particle with three dimensions of less than 100 nanometers. The study of such nanoparticles requires powerful microscopic techniques. In recent 20 years, the classical method, electron microscopy, was accompanied by another method, atomic force microscopy, based on scanning the sample with a sharp tip moving at a small distance above the sample. In comparison with electron microscopy, the application of atomic force microscopy offers the capability of three-imensionalvisualization and enables to get information on size and morpohology. However, there are often some deteriorations, a convolution being the most important one. In this review, we try to resume diverse applications, where atomic force microscopy was usedto support a research of nanoparticles. Not only showing the range of applications, we highlight scopes, where atomic force microscopy exceeds electron microscopy methods and also draw attention to problems of atomic force microscopy ima

Název v anglickém jazyce

The Role of Atomic Force Microscopy in Nanoparticle Research

Popis výsledku anglicky

Nanoparticles include any type of a particle with three dimensions of less than 100 nanometers. The study of such nanoparticles requires powerful microscopic techniques. In recent 20 years, the classical method, electron microscopy, was accompanied by another method, atomic force microscopy, based on scanning the sample with a sharp tip moving at a small distance above the sample. In comparison with electron microscopy, the application of atomic force microscopy offers the capability of three-imensionalvisualization and enables to get information on size and morpohology. However, there are often some deteriorations, a convolution being the most important one. In this review, we try to resume diverse applications, where atomic force microscopy was usedto support a research of nanoparticles. Not only showing the range of applications, we highlight scopes, where atomic force microscopy exceeds electron microscopy methods and also draw attention to problems of atomic force microscopy ima

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/1M0512" target="_blank" >1M0512: Centrrum výzkumu práškových nanomateriálů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Advanced Microscopy Research

ISSN

2156-7573

e-ISSN

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Svazek periodika

5

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

11

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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