Vortex topographic microscopy for full-field reference-free imaging and testing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F17%3A73581722" target="_blank" >RIV/61989592:15310/17:73581722 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26620/17:PU124310

Výsledek na webu

<a href="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-18-21428&id=371047" target="_blank" >https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-18-21428&id=371047</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.25.021428" target="_blank" >10.1364/OE.25.021428</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Vortex topographic microscopy for full-field reference-free imaging and testing

Popis výsledku v původním jazyce

Light vortices carry orbital angular momentum and have a variety of applications in optical manipulation, high-capacity communications or microscopy. Here we propose a new concept of full-field vortex topographic microscopy enabling a reference-free displacement and shape measurement of reflective samples. The sample surface is mapped by an array of light spots enabling quantitative reconstruction of the local depths from defocused wavefronts. Light from the spots is converted to a lattice of mutually uncorrelated doublehelix point spread functions (PSFs) whose angular rotation enables depth estimation. The PSFs are created by self-interference of optical vortices that originate from the same wavefront and are shaped by a spiral phase mask (SPM). The method benefits from the isoplanatic PSFs whose shape and size remain unchanged under defocusing, ensuring high precision in a wide range of measured depths. The technique was tested using a microscope Nikon Eclipse E600 working with a micro-hole plate providing structured illumination and the SPM placed in the imaging path. The depth measurement was demonstrated in the range of 11 mu m exceeding the depth of field of the microscope objective up to 19 times. Throughout this range, the surface depth was mapped with the precision better than 30 nm at the lateral positions given with the precision better than 10 nm. Application potential of the method was demonstrated by profiling the top surface of a bearing ball and reconstructing the threedimensional relief of a reflection phase grating.

Název v anglickém jazyce

Vortex topographic microscopy for full-field reference-free imaging and testing

Popis výsledku anglicky

Light vortices carry orbital angular momentum and have a variety of applications in optical manipulation, high-capacity communications or microscopy. Here we propose a new concept of full-field vortex topographic microscopy enabling a reference-free displacement and shape measurement of reflective samples. The sample surface is mapped by an array of light spots enabling quantitative reconstruction of the local depths from defocused wavefronts. Light from the spots is converted to a lattice of mutually uncorrelated doublehelix point spread functions (PSFs) whose angular rotation enables depth estimation. The PSFs are created by self-interference of optical vortices that originate from the same wavefront and are shaped by a spiral phase mask (SPM). The method benefits from the isoplanatic PSFs whose shape and size remain unchanged under defocusing, ensuring high precision in a wide range of measured depths. The technique was tested using a microscope Nikon Eclipse E600 working with a micro-hole plate providing structured illumination and the SPM placed in the imaging path. The depth measurement was demonstrated in the range of 11 mu m exceeding the depth of field of the microscope objective up to 19 times. Throughout this range, the surface depth was mapped with the precision better than 30 nm at the lateral positions given with the precision better than 10 nm. Application potential of the method was demonstrated by profiling the top surface of a bearing ball and reconstructing the threedimensional relief of a reflection phase grating.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Express

ISSN

1094-4087

e-ISSN

—

Svazek periodika

25

Číslo periodika v rámci svazku

18

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

16

Strana od-do

21428-21443

Kód UT WoS článku

000411529000043

EID výsledku v databázi Scopus

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