Why monitor acoustic emissions during nanomechanical tests?

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F20%3A73602038" target="_blank" >RIV/61989592:15310/20:73602038 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68378271:_____/20:00537579

Výsledek na webu

<a href="https://ojs.cvut.cz/ojs/index.php/APP/article/view/6705/5747" target="_blank" >https://ojs.cvut.cz/ojs/index.php/APP/article/view/6705/5747</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.14311/APP.2020.27.0126" target="_blank" >10.14311/APP.2020.27.0126</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Why monitor acoustic emissions during nanomechanical tests?

Popis výsledku v původním jazyce

Acoustic Emissions (AE) monitoring has been proved as an effective non-destructive technique at the macro scale. Nevertheless, it may also be employed at nano/micro scale during nanomechanical and nanotribological testing. Local mechanical properties of surfaces or micro object are routinely explored using nanoindentation, scratch test or dynamic impact tests that are evaluated based on analysis of depth-load-time records or microscopic observation of residual indents, scratch grooves or impact craters, respectively. Although these approaches have been proven to be sufficient in most cases for a variety of materials, there are many situations where they do not provide sufficient information for a complex understanding of the deformation response. On the other hand, analysis of AE signals generated during these tests may provide valuable complementary information and provide some insight into the dynamics of phenomena like cracking, phase transitions, plastic instabilities, etc. That means that the analysis of acoustic emissions provides a better understanding and more complex interpretation of the results obtained by the above-mentioned tests. The strength of the AE based method is demonstrated for optical thin films deposited on glass tested via scratch test. Combination of AE and nanoindentation will be presented for various types of glasses. The complementary analysis of the time and frequency domain will draw the potential of the AE extended approach. Especially dynamics of the failure and fracture processes will be distinguished and elucidated. In both cases the analysis of AE events will be correlated with standard approaches.

Název v anglickém jazyce

Why monitor acoustic emissions during nanomechanical tests?

Popis výsledku anglicky

Acoustic Emissions (AE) monitoring has been proved as an effective non-destructive technique at the macro scale. Nevertheless, it may also be employed at nano/micro scale during nanomechanical and nanotribological testing. Local mechanical properties of surfaces or micro object are routinely explored using nanoindentation, scratch test or dynamic impact tests that are evaluated based on analysis of depth-load-time records or microscopic observation of residual indents, scratch grooves or impact craters, respectively. Although these approaches have been proven to be sufficient in most cases for a variety of materials, there are many situations where they do not provide sufficient information for a complex understanding of the deformation response. On the other hand, analysis of AE signals generated during these tests may provide valuable complementary information and provide some insight into the dynamics of phenomena like cracking, phase transitions, plastic instabilities, etc. That means that the analysis of acoustic emissions provides a better understanding and more complex interpretation of the results obtained by the above-mentioned tests. The strength of the AE based method is demonstrated for optical thin films deposited on glass tested via scratch test. Combination of AE and nanoindentation will be presented for various types of glasses. The complementary analysis of the time and frequency domain will draw the potential of the AE extended approach. Especially dynamics of the failure and fracture processes will be distinguished and elucidated. In both cases the analysis of AE events will be correlated with standard approaches.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

14th International conference on Local mechanical properties - LMP 2019

ISBN

978-80-01-06735-2

ISSN

—

e-ISSN

2336-5382

Počet stran výsledku

5

Strana od-do

126-130

Název nakladatele

ČVUT v Praze

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

6. 11. 2019

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

—