Unified Simulation Platform for Interference Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F24%3A73625417" target="_blank" >RIV/61989592:15310/24:73625417 - isvavai.cz</a>

Výsledek na webu

<a href="https://pubs.acs.org/doi/10.1021/acsphotonics.4c00621" target="_blank" >https://pubs.acs.org/doi/10.1021/acsphotonics.4c00621</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acsphotonics.4c00621" target="_blank" >10.1021/acsphotonics.4c00621</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Unified Simulation Platform for Interference Microscopy

Popis výsledku v původním jazyce

Interferometric scattering microscopy is a powerful technique that enables various applications, such as mass photometry and particle tracking. Here, we present a numerical toolbox to simulate images obtained in interferometric scattering, coherent bright-field, and dark-field microscopies. The scattered fields are calculated using a boundary element method, facilitating the simulation of arbitrary sample geometries and substrate layer structures. A fully vectorial model is used for simulating the imaging setup. We demonstrate excellent agreement between our simulations and experiments for different shapes of scatterers and excitation angles. Notably, for angles near the Brewster angle, we observe a contrast enhancement which may be beneficial for nanosensing applications. The software is available as a matlab toolbox.

Název v anglickém jazyce

Unified Simulation Platform for Interference Microscopy

Popis výsledku anglicky

Interferometric scattering microscopy is a powerful technique that enables various applications, such as mass photometry and particle tracking. Here, we present a numerical toolbox to simulate images obtained in interferometric scattering, coherent bright-field, and dark-field microscopies. The scattered fields are calculated using a boundary element method, facilitating the simulation of arbitrary sample geometries and substrate layer structures. A fully vectorial model is used for simulating the imaging setup. We demonstrate excellent agreement between our simulations and experiments for different shapes of scatterers and excitation angles. Notably, for angles near the Brewster angle, we observe a contrast enhancement which may be beneficial for nanosensing applications. The software is available as a matlab toolbox.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ACS Photonics

ISSN

2330-4022

e-ISSN

—

Svazek periodika

11

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

12

Strana od-do

2745-2756

Kód UT WoS článku

001249618000001

EID výsledku v databázi Scopus

2-s2.0-85196761720