Interfacial States in Au/Reduced TiO2 Plasmonic Photocatalysts Quench Hot-Carrier Photoactivity

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15640%2F23%3A73620164" target="_blank" >RIV/61989592:15640/23:73620164 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27640/23:10253036

Výsledek na webu

<a href="https://pubs.acs.org/doi/10.1021/acs.jpcc.3c04176" target="_blank" >https://pubs.acs.org/doi/10.1021/acs.jpcc.3c04176</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acs.jpcc.3c04176" target="_blank" >10.1021/acs.jpcc.3c04176</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Interfacial States in Au/Reduced TiO2 Plasmonic Photocatalysts Quench Hot-Carrier Photoactivity

Popis výsledku v původním jazyce

Understanding the interface of plasmonic nanostructuresis essentialfor improving the performance of photocatalysts. Surface defects insemiconductors modify the dynamics of charge carriers, which are notwell understood yet. Here, we take advantage of scanning photoelectrochemicalmicroscopy (SPECM) as a fast and effective tool for detecting theimpact of surface defects on the photoactivity of plasmonic hybridnanostructures. We evidenced a significant photoactivity activationof TiO2 ultrathin films under visible light upon mild reductiontreatment. Through Au nanoparticle (NP) arrays deposited on differentreduced TiO2 films, the plasmonic photoactivity mappingrevealed the effect of interfacial defects on hot charge carriers,which quenched the plasmonic activity by (i) increasing the recombinationrate between hot charge carriers and (ii) leaking electrons (injectedand generated in TiO2) into the Au NPs. Our results showthat the catalyst&apos;s photoactivity depends on the concentrationof surface defects and the population distribution of Au NPs. Thepresent study unlocks the fast and simple detection of the surfaceengineering effect on the photocatalytic activity of plasmonic semiconductorsystems.

Název v anglickém jazyce

Interfacial States in Au/Reduced TiO2 Plasmonic Photocatalysts Quench Hot-Carrier Photoactivity

Popis výsledku anglicky

Understanding the interface of plasmonic nanostructuresis essentialfor improving the performance of photocatalysts. Surface defects insemiconductors modify the dynamics of charge carriers, which are notwell understood yet. Here, we take advantage of scanning photoelectrochemicalmicroscopy (SPECM) as a fast and effective tool for detecting theimpact of surface defects on the photoactivity of plasmonic hybridnanostructures. We evidenced a significant photoactivity activationof TiO2 ultrathin films under visible light upon mild reductiontreatment. Through Au nanoparticle (NP) arrays deposited on differentreduced TiO2 films, the plasmonic photoactivity mappingrevealed the effect of interfacial defects on hot charge carriers,which quenched the plasmonic activity by (i) increasing the recombinationrate between hot charge carriers and (ii) leaking electrons (injectedand generated in TiO2) into the Au NPs. Our results showthat the catalyst&apos;s photoactivity depends on the concentrationof surface defects and the population distribution of Au NPs. Thepresent study unlocks the fast and simple detection of the surfaceengineering effect on the photocatalytic activity of plasmonic semiconductorsystems.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21002 - Nano-processes (applications on nano-scale); (biomaterials to be 2.9)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Physical Chemistry C

ISSN

1932-7447

e-ISSN

1932-7455

Svazek periodika

127

Číslo periodika v rámci svazku

132

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

"15861 "- 15870

Kód UT WoS článku

001043807300001

EID výsledku v databázi Scopus

2-s2.0-85168455106