Perspective on reliability assessment principles of platinum thermometer based on accelerated tests

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F62156489%3A43110%2F19%3A43916610" target="_blank" >RIV/62156489:43110/19:43916610 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60162694:G43__/19:00537276

Výsledek na webu

<a href="https://doi.org/10.1016/j.microrel.2019.113469" target="_blank" >https://doi.org/10.1016/j.microrel.2019.113469</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.microrel.2019.113469" target="_blank" >10.1016/j.microrel.2019.113469</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Perspective on reliability assessment principles of platinum thermometer based on accelerated tests

Popis výsledku v původním jazyce

Assuring dependability is a key aspect of quality. In this article we introduce the results of platinum thermometer (Pt100) accelerated reliability tests. The thermometer is a monitoring and safety subsystem, usually embedded. The level of Pt100 reliability performance is therefore expected to be very high. In order to determine Pt100 reliability we performed a new format of accelerated reliability test and propose novel methods for reliability measure estimations. The format of the test suits a real Pt100 application. The test results have been used for specifying the compliance of the tested Pt100 with customer requirements. Based on the characteristics of the problem, we applied both parametric and non-parametric approaches when studying the degradation and faults of tested thermometers.

Název v anglickém jazyce

Perspective on reliability assessment principles of platinum thermometer based on accelerated tests

Popis výsledku anglicky

Assuring dependability is a key aspect of quality. In this article we introduce the results of platinum thermometer (Pt100) accelerated reliability tests. The thermometer is a monitoring and safety subsystem, usually embedded. The level of Pt100 reliability performance is therefore expected to be very high. In order to determine Pt100 reliability we performed a new format of accelerated reliability test and propose novel methods for reliability measure estimations. The format of the test suits a real Pt100 application. The test results have been used for specifying the compliance of the tested Pt100 with customer requirements. Based on the characteristics of the problem, we applied both parametric and non-parametric approaches when studying the degradation and faults of tested thermometers.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microelectronics Reliability

ISSN

0026-2714

e-ISSN

—

Svazek periodika

100-101

Číslo periodika v rámci svazku

September

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

113469

Kód UT WoS článku

000503907900019

EID výsledku v databázi Scopus

2-s2.0-85074728102