Mechanism of negative ion emission from surfaces of ferroelectrics

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F12%3A00377433" target="_blank" >RIV/67985882:_____/12:00377433 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.sciencedirect.com/science/article/pii/S0039602812001525#gts0005" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0039602812001525#gts0005</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.susc.2012.04.020" target="_blank" >10.1016/j.susc.2012.04.020</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Mechanism of negative ion emission from surfaces of ferroelectrics

Popis výsledku v původním jazyce

Experimental studies of the mechanism of negative ion and cluster ion emission from surfaces of ferroelectrics are described. The emission was produced by negative voltage pulses with the amplitude of about 400 V, with a rapid rise-time (below 10 ns) anda slow decay-time (several ?s). The pulses were applied between the back side of the ferroelectric sample and the metal tip touching the front emitting side. The surface of the ferroelectrics could be cleaned in situ by 1 keV Ar + bombardment. The morphologic changes around the tip were observed with an atomic force microscope (AFM). Mostly negative ions and cluster ions were emitted and studied in our experiments. Positive ions were detected with much lower probability and are produced by an entirelydifferent microscopic process than negative ions. Masses as well as energies of emitted ions were measured with a time-of-flight (TOF) spectrometer and compared with available spontaneous desorption (SD) spectra and Cs -SIMS spectra in or

Název v anglickém jazyce

Mechanism of negative ion emission from surfaces of ferroelectrics

Popis výsledku anglicky

Experimental studies of the mechanism of negative ion and cluster ion emission from surfaces of ferroelectrics are described. The emission was produced by negative voltage pulses with the amplitude of about 400 V, with a rapid rise-time (below 10 ns) anda slow decay-time (several ?s). The pulses were applied between the back side of the ferroelectric sample and the metal tip touching the front emitting side. The surface of the ferroelectrics could be cleaned in situ by 1 keV Ar + bombardment. The morphologic changes around the tip were observed with an atomic force microscope (AFM). Mostly negative ions and cluster ions were emitted and studied in our experiments. Positive ions were detected with much lower probability and are produced by an entirelydifferent microscopic process than negative ions. Masses as well as energies of emitted ions were measured with a time-of-flight (TOF) spectrometer and compared with available spontaneous desorption (SD) spectra and Cs -SIMS spectra in or

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Surface Science

ISSN

0039-6028

e-ISSN

—

Svazek periodika

606

Číslo periodika v rámci svazku

15-16

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

1327-1330

Kód UT WoS článku

000305845600035

EID výsledku v databázi Scopus

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