Disorder effects in subwavelength grating metamaterial waveguides

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F17%3A00484771" target="_blank" >RIV/67985882:_____/17:00484771 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1364/OE.25.012222" target="_blank" >http://dx.doi.org/10.1364/OE.25.012222</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.25.012222" target="_blank" >10.1364/OE.25.012222</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Disorder effects in subwavelength grating metamaterial waveguides

Popis výsledku v původním jazyce

Subwavelength grating (SWG) waveguides are integrated photonic structures with a pitch substantially smaller than wavelength for which they are designed, so that diffraction effects are suppressed. SWG operates as an artificial metamaterial with an equivalent refractive index which depends on the geometry of the structure and the polarization of the propagating wave. SWG waveguides have been advantageously used in silicon photonics, resulting in significant performance improvements for many practical devices, including highly efficient fiber-chip couplers, waveguide crossings, broadband multimode interference (MMI) couplers, evanescent field sensors and polarization beam splitters, to name a few. Here we present a theoretical and experimental study of the influence of disorder effects in SWG waveguides. We demonstrate via electromagnetic simulations and experimental measurements that even a comparatively small jitter (similar to 5 nm) in the position and size of the SWG segments may cause a dramatic reduction in the transmittance for wide (multimode) SWG waveguides, while for narrow (single mode) waveguides this effect is negligible. Our study shows that the impact of the jitter on SWG waveguide performance is directly related to the modal confinement

Název v anglickém jazyce

Disorder effects in subwavelength grating metamaterial waveguides

Popis výsledku anglicky

Subwavelength grating (SWG) waveguides are integrated photonic structures with a pitch substantially smaller than wavelength for which they are designed, so that diffraction effects are suppressed. SWG operates as an artificial metamaterial with an equivalent refractive index which depends on the geometry of the structure and the polarization of the propagating wave. SWG waveguides have been advantageously used in silicon photonics, resulting in significant performance improvements for many practical devices, including highly efficient fiber-chip couplers, waveguide crossings, broadband multimode interference (MMI) couplers, evanescent field sensors and polarization beam splitters, to name a few. Here we present a theoretical and experimental study of the influence of disorder effects in SWG waveguides. We demonstrate via electromagnetic simulations and experimental measurements that even a comparatively small jitter (similar to 5 nm) in the position and size of the SWG segments may cause a dramatic reduction in the transmittance for wide (multimode) SWG waveguides, while for narrow (single mode) waveguides this effect is negligible. Our study shows that the impact of the jitter on SWG waveguide performance is directly related to the modal confinement

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/GA16-00329S" target="_blank" >GA16-00329S: Nové efekty a funkcionality v subvlnových vlnovodných fotonických strukturách</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Express

ISSN

1094-4087

e-ISSN

—

Svazek periodika

25

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

15

Strana od-do

12222-12236

Kód UT WoS článku

000403940700017

EID výsledku v databázi Scopus

2-s2.0-85019995568