Deformation mechanisms of Al thin films: In-situ TEM and molecular dynamics study

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F22%3A00557624" target="_blank" >RIV/68081723:_____/22:00557624 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216208:11320/22:10446985

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S1359646222001889?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S1359646222001889?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.scriptamat.2022.114688" target="_blank" >10.1016/j.scriptamat.2022.114688</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Deformation mechanisms of Al thin films: In-situ TEM and molecular dynamics study

Popis výsledku v původním jazyce

Molecular dynamics (MD) is a simulation method regularly used for examining the mechanical properties of materials on an atomic level. Despite many reasonable results obtained by this method, it remains unclear how well an MD simulation can reproduce the results of a specific experiment. Thin aluminum-based films were deformed in-situ in a transmission electron microscope (TEM). Grain boundary processes were identified as the primary deformation mechanism, and grain rotations during deformation were confirmed by automatic orientation maps. Tensile deformation of Al-based thin films with columnar grains corresponding to the material structure observed in the experiment was then simulated using MD. Several main attributes of the simulation were found to match the experimental results. The effect of grain orientation on intragranular dislocation activity was observed by TEM and confirmed by MD simulations.

Název v anglickém jazyce

Deformation mechanisms of Al thin films: In-situ TEM and molecular dynamics study

Popis výsledku anglicky

Molecular dynamics (MD) is a simulation method regularly used for examining the mechanical properties of materials on an atomic level. Despite many reasonable results obtained by this method, it remains unclear how well an MD simulation can reproduce the results of a specific experiment. Thin aluminum-based films were deformed in-situ in a transmission electron microscope (TEM). Grain boundary processes were identified as the primary deformation mechanism, and grain rotations during deformation were confirmed by automatic orientation maps. Tensile deformation of Al-based thin films with columnar grains corresponding to the material structure observed in the experiment was then simulated using MD. Several main attributes of the simulation were found to match the experimental results. The effect of grain orientation on intragranular dislocation activity was observed by TEM and confirmed by MD simulations.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21001 - Nano-materials (production and properties)

Projekt

<a href="/cs/project/EF15_003%2F0000485" target="_blank" >EF15_003/0000485: Centrum nanomateriálů pro pokročilé aplikace</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Scripta Materialia

ISSN

1359-6462

e-ISSN

1872-8456

Svazek periodika

215

Číslo periodika v rámci svazku

JUL

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

114688

Kód UT WoS článku

000791282900001

EID výsledku v databázi Scopus

2-s2.0-85127039949