Rentgenová difrakce stojaté vlny na polykrystalických multivrstvách

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F08%3A00308224" target="_blank" >RIV/68081731:_____/08:00308224 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216224:14310/08:00026390 RIV/00216208:11320/08:00206070

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Standing-wave effects in grazing-incidence x-ray diffraction from polycrystalline multilayers

Popis výsledku v původním jazyce

The intensity of x-ray diffraction from a polycrystalline multilayer in a grazing-incidence scattering geometry is modulated by a standing wave created by the interference of the radiation transmitted through the multilayer stack with the wave field specularly reflected from the superlattice interfaces. Similarly, the radiation being diffracted from the polycrystalline structure is reflected specularly from the interfaces and a standing-wave interference pattern results as well. This effect is demonstrated by a series of diffraction measurements on C/Ni periodic multilayers; the experimental data have been modeled using the distorted-wave Born approximation and a very good correspondence with the experiments was achieved. The method was used for the study of the profiles of the crystallite sizes and strains in multilayers.

Název v anglickém jazyce

Standing-wave effects in grazing-incidence x-ray diffraction from polycrystalline multilayers

Popis výsledku anglicky

The intensity of x-ray diffraction from a polycrystalline multilayer in a grazing-incidence scattering geometry is modulated by a standing wave created by the interference of the radiation transmitted through the multilayer stack with the wave field specularly reflected from the superlattice interfaces. Similarly, the radiation being diffracted from the polycrystalline structure is reflected specularly from the interfaces and a standing-wave interference pattern results as well. This effect is demonstrated by a series of diffraction measurements on C/Ni periodic multilayers; the experimental data have been modeled using the distorted-wave Born approximation and a very good correspondence with the experiments was achieved. The method was used for the study of the profiles of the crystallite sizes and strains in multilayers.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

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Svazek periodika

103

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

7

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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