Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434111" target="_blank" >RIV/68081731:_____/14:00434111 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
Popis výsledku v původním jazyce
Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM
Název v anglickém jazyce
Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
Popis výsledku anglicky
Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
JA - Elektronika a optoelektronika, elektrotechnika
OECD FORD obor
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Návaznosti výsledku
Projekt
<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2014
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
18th International Microscopy Congres. Proceedings
ISBN
978-80-260-6720-7
ISSN
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e-ISSN
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Počet stran výsledku
2
Strana od-do
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Název nakladatele
Czechoslovak Microscopy Society
Místo vydání
Praha
Místo konání akce
Praha
Datum konání akce
7. 9. 2014
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
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