SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00507183" target="_blank" >RIV/68081731:_____/14:00507183 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1088/1757-899X/55/1/012008" target="_blank" >http://dx.doi.org/10.1088/1757-899X/55/1/012008</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1757-899X/55/1/012008" target="_blank" >10.1088/1757-899X/55/1/012008</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
Popis výsledku v původním jazyce
The demand to produce electrical power with higher efficiency and with lower environmental pollution is leading to the use of new advanced materials in the production of power plant equipment. To understand the processes taking place in parts produced from these materials during their operation under severe conditions (such as high temperature, high stress, and environmental corrosion) requires detailed evaluation of their substructure. It is usually necessary to use transmission electron microscopy (TEM). However, this method is very exacting and time-consuming. So there is an effort to use new scanning electron microscopy techniques instead of TEM. One of them is scanning low energy electron microscopy (SLEEM). This paper deals with an assessment of the possibility to use SLEEM for describing the substructure of creep resistant steel CB2 after long-term creep testing. In the SLEEM images more information is contained about the microstructure of the material in comparison with standard scanning electron microscopy. Study of materials using slow and very slow electrons opens the way to better understanding their microstructures.
Název v anglickém jazyce
SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
Popis výsledku anglicky
The demand to produce electrical power with higher efficiency and with lower environmental pollution is leading to the use of new advanced materials in the production of power plant equipment. To understand the processes taking place in parts produced from these materials during their operation under severe conditions (such as high temperature, high stress, and environmental corrosion) requires detailed evaluation of their substructure. It is usually necessary to use transmission electron microscopy (TEM). However, this method is very exacting and time-consuming. So there is an effort to use new scanning electron microscopy techniques instead of TEM. One of them is scanning low energy electron microscopy (SLEEM). This paper deals with an assessment of the possibility to use SLEEM for describing the substructure of creep resistant steel CB2 after long-term creep testing. In the SLEEM images more information is contained about the microstructure of the material in comparison with standard scanning electron microscopy. Study of materials using slow and very slow electrons opens the way to better understanding their microstructures.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
21001 - Nano-materials (production and properties)
Návaznosti výsledku
Projekt
<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2014
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis
ISBN
—
ISSN
1757-8981
e-ISSN
—
Počet stran výsledku
10
Strana od-do
012008
Název nakladatele
IOP
Místo vydání
Bristol
Místo konání akce
Porto
Datum konání akce
12. 5. 2013
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000337273400008