The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F21%3A00551131" target="_blank" >RIV/68081731:_____/21:00551131 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086" target="_blank" >https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

Popis výsledku v původním jazyce

Both electron microscopy and spectroscopy are powerful tools to gain information about structure and properties of various materials. We have developed a unique ultra-high vacuum instrument capable of analyzing samples via transmitted electrons in two complementary modes. These two modes are a standard microscopic regime in the range of energies from 5 keV down to few eV and a time-of-flight (ToF) method. Standard ToF spectrometers operate in energy range above 500 eV and detect reflected electrons. Our new ToF spectrometer is able to operate with energies of incident electrons below 300 eV. It detects transmitted electrons since the drift tube and detector are conveniently located below the analyzed sample. In order to apply these methods and interpret corresponding results correctly, deep understanding of electron transport phenomena in solids is required.

Název v anglickém jazyce

The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

Popis výsledku anglicky

Both electron microscopy and spectroscopy are powerful tools to gain information about structure and properties of various materials. We have developed a unique ultra-high vacuum instrument capable of analyzing samples via transmitted electrons in two complementary modes. These two modes are a standard microscopic regime in the range of energies from 5 keV down to few eV and a time-of-flight (ToF) method. Standard ToF spectrometers operate in energy range above 500 eV and detect reflected electrons. Our new ToF spectrometer is able to operate with energies of incident electrons below 300 eV. It detects transmitted electrons since the drift tube and detector are conveniently located below the analyzed sample. In order to apply these methods and interpret corresponding results correctly, deep understanding of electron transport phenomena in solids is required.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů